In this paper, we report on room temperature detection of terahertz radiation from strained-Si modulation-doped field-effect transistors. A non-resonant signal was observed with a maximum around the threshold voltage. The signal was interpreted due to the plasma wave nonlinearities in the channel. The intensity of the signal increases for the higher applied drain-to-source current. We also observed a dependence of the signal on the polarization of the incoming radiations.