Strategy to utilize transmission electron microscopy and X-ray diffraction to investigate biaxial strain effect in epitaxial BiFeO3 films

In Tae Bae, Tomohiro Ichinose, Shintaro Yasui, András Kovács, Hong Jian Zhao, Jorge Íñiguez, Hiroshi Naganuma

Research output: Contribution to journal › Review article › peer-review

5 Citations (Scopus)

Fingerprint

Dive into the research topics of 'Strategy to utilize transmission electron microscopy and X-ray diffraction to investigate biaxial strain effect in epitaxial BiFeO3 films'. Together they form a unique fingerprint.

Material Science

Physics