Structural analysis of interfacial strained epitaxial BiMnO3 films fabricated by chemical solution deposition

Hiroshi Naganuma; Andras Kovacs; Tetsuro Harima; Hiromi Shima; Soichiro Okamura; Yoshihiko Hirotsu

doi:10.1063/1.3074096

Structural analysis of interfacial strained epitaxial BiMnO3 films fabricated by chemical solution deposition

Hiroshi Naganuma, Andras Kovacs, Tetsuro Harima, Hiromi Shima, Soichiro Okamura, Yoshihiko Hirotsu

Center for Innovative Integrated Electronic Systems (CIES)

Research output: Contribution to journal › Article › peer-review

3 Citations (Scopus)

Abstract

An interfacial epitaxial BiMnO3 layer was fabricated by chemical solution deposition on SrTiO3 (100) substrate, and the microstructure of the film was analyzed by x-ray diffraction (XRD) and cross-sectional transmission electron microscopy (TEM). The TEM observation revealed the epitaxial growth of BiMnO3 on the SrTiO3 substrate as follows: ([110] (001)) BiMnO3 [0-10] (001) SrTiO3. XRD and TEM analyses revealed that the mismatch between the epitaxial BiMnO3 and the SrTiO3 substrate causes a distortion in lattice parameters of BiMnO3 and, consequently, a large compressive strain in the BiMnO3 layer.

Original language	English
Article number	07D915
Journal	Journal of Applied Physics
Volume	105
Issue number	7
DOIs	https://doi.org/10.1063/1.3074096
Publication status	Published - 2009

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title = "Structural analysis of interfacial strained epitaxial BiMnO3 films fabricated by chemical solution deposition",

abstract = "An interfacial epitaxial BiMnO3 layer was fabricated by chemical solution deposition on SrTiO3 (100) substrate, and the microstructure of the film was analyzed by x-ray diffraction (XRD) and cross-sectional transmission electron microscopy (TEM). The TEM observation revealed the epitaxial growth of BiMnO3 on the SrTiO3 substrate as follows: ([110] (001)) BiMnO3 [0-10] (001) SrTiO3. XRD and TEM analyses revealed that the mismatch between the epitaxial BiMnO3 and the SrTiO3 substrate causes a distortion in lattice parameters of BiMnO3 and, consequently, a large compressive strain in the BiMnO3 layer.",

author = "Hiroshi Naganuma and Andras Kovacs and Tetsuro Harima and Hiromi Shima and Soichiro Okamura and Yoshihiko Hirotsu",

note = "Funding Information: This study was partly supported by a Grant-in-Aid for Young Scientist B program Grant No. 20760474 from the Ministry of Education, Culture, Sports, Science and Technology, Japan.",

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doi = "10.1063/1.3074096",

language = "English",

volume = "105",

journal = "Journal of Applied Physics",

issn = "0021-8979",

publisher = "American Institute of Physics",

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TY - JOUR

T1 - Structural analysis of interfacial strained epitaxial BiMnO3 films fabricated by chemical solution deposition

AU - Naganuma, Hiroshi

AU - Kovacs, Andras

AU - Harima, Tetsuro

AU - Shima, Hiromi

AU - Okamura, Soichiro

AU - Hirotsu, Yoshihiko

N1 - Funding Information: This study was partly supported by a Grant-in-Aid for Young Scientist B program Grant No. 20760474 from the Ministry of Education, Culture, Sports, Science and Technology, Japan.

PY - 2009

Y1 - 2009

N2 - An interfacial epitaxial BiMnO3 layer was fabricated by chemical solution deposition on SrTiO3 (100) substrate, and the microstructure of the film was analyzed by x-ray diffraction (XRD) and cross-sectional transmission electron microscopy (TEM). The TEM observation revealed the epitaxial growth of BiMnO3 on the SrTiO3 substrate as follows: ([110] (001)) BiMnO3 [0-10] (001) SrTiO3. XRD and TEM analyses revealed that the mismatch between the epitaxial BiMnO3 and the SrTiO3 substrate causes a distortion in lattice parameters of BiMnO3 and, consequently, a large compressive strain in the BiMnO3 layer.

AB - An interfacial epitaxial BiMnO3 layer was fabricated by chemical solution deposition on SrTiO3 (100) substrate, and the microstructure of the film was analyzed by x-ray diffraction (XRD) and cross-sectional transmission electron microscopy (TEM). The TEM observation revealed the epitaxial growth of BiMnO3 on the SrTiO3 substrate as follows: ([110] (001)) BiMnO3 [0-10] (001) SrTiO3. XRD and TEM analyses revealed that the mismatch between the epitaxial BiMnO3 and the SrTiO3 substrate causes a distortion in lattice parameters of BiMnO3 and, consequently, a large compressive strain in the BiMnO3 layer.

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VL - 105

JO - Journal of Applied Physics

JF - Journal of Applied Physics

IS - 7

M1 - 07D915

ER -

Structural analysis of interfacial strained epitaxial BiMnO3 films fabricated by chemical solution deposition

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