Structural Investigation and Indium Substitution in the Thermoelectric Mn2.7Cr0.3Si4Al2−xInx Series

Tristan Barbier, Emmanuel Combe, Ryoji Funahashi, Tomonori Takeuchi, Masataka Kubouchi, Yuzuru Miyazaki, Emmanuel Guilmeau, Ryosuke O. Suzuki

Research output: Contribution to journalArticlepeer-review


Following the recent discovery of the promising Mn2.7Cr0.3Si4Al2 thermoelectric compound (having, e.g., automotive, industrial, and solar conversion applications), structural characterization by x-ray single-crystal diffraction analysis has been performed. This layered material is composed of two distinct crystallographic sites where both (Mn, Cr) and (Al, Si) are randomly distributed. The deduced crystallographic parameters were then confirmed by powder x-ray diffraction analysis through a temperature dependence of the phase stability, showing at the same time chemical stability up to 873 K. Taking into account the two distinct crystallographic sites highlighted, samples possessing two guest elements, one on each site, were then synthesized to improve the thermoelectric properties. A solid solution is found in the system Mn2.7Cr0.3Si4Al2−xInx with x varying from 0 to 0.2. Thus, double-substituted samples were studied by x-ray diffraction, electrical, and thermal measurements. The present paper describes and discusses the experimental results obtained.

Original languageEnglish
Pages (from-to)1992-1999
Number of pages8
JournalJournal of Electronic Materials
Issue number3
Publication statusPublished - 2016 Mar 1


  • Thermoelectric
  • silicide compounds
  • single crystals
  • x-ray diffraction


Dive into the research topics of 'Structural Investigation and Indium Substitution in the Thermoelectric Mn2.7Cr0.3Si4Al2−xInx Series'. Together they form a unique fingerprint.

Cite this