Abstract
Ge3Sb2Te6 was analyzed in detail using an x-ray diffraction method. The crystal of this material in the space group R3̄m is characterized as a 33-layered cubic close-packed stacking structure. Te atoms fully occupy their specific layers, whereas Ge and Sb atoms are located in other layers thus causing partial atomic disordering. Te and Ge/Sb layers are laminated alternately 11 times to form a NaCl block. Electron density distributions in the crystal were obtained using the maximum entropy method and band calculation, which showed very good agreement with each other. Ge3Sb2Te6 is a compound semiconductor with a very narrow band gap.
Original language | English |
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Article number | 161919 |
Journal | Applied Physics Letters |
Volume | 90 |
Issue number | 16 |
DOIs | |
Publication status | Published - 2007 |
Externally published | Yes |
ASJC Scopus subject areas
- Physics and Astronomy (miscellaneous)