Structural study of Si(1 1 1)√21 × √21-(Ag + Au) surface by X-ray diffraction

H. Tajiri, K. Sumitani, W. Yashiro, S. Nakatani, T. Takahashi, K. Akimoto, H. Sugiyama, X. Zhang, H. Kawata

Research output: Contribution to journalArticlepeer-review

25 Citations (Scopus)


The in-plane structure of Si(1 1 1)√21 × √21-(Ag + Au) surface was studied by using grazing incidence X-ray diffraction method. A total of 72 inequivalent fractional order reflections were obtained. The structural models are investigated including the previously proposed models. It is found that the Ag triangles and Si trimers are induced to displace considerably from the honeycomb chained triangle arrangement by the adsorption of Au atoms. From the analysis, the models with five Au atoms in the unit cell, which have the Au-Au interatomic distance peculiar to the √21 × √21 periodicity, are favored.

Original languageEnglish
Pages (from-to)214-220
Number of pages7
JournalSurface Science
Issue number1-3
Publication statusPublished - 2001 Nov 1
Externally publishedYes


  • Gold
  • Silicon
  • Silver
  • Surface relaxation and reconstruction
  • Surface structure, morphology, roughness, and topography
  • X-ray scattering, diffraction, and reflection

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Materials Chemistry


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