Structure and Thickness of Natural Oxide Layer on Ultrafine Particle

Koichi Tamura; Yuki Kimura; Hitoshi Suzuki; Osamu Kido; Takeshi Sato; Toshiaki Tanigaki; Mami Kurumada; Yoshio Saito; Chihiro Kaito

doi:10.1143/jjap.42.7489

Structure and Thickness of Natural Oxide Layer on Ultrafine Particle

Koichi Tamura, Yuki Kimura, Hitoshi Suzuki, Osamu Kido, Takeshi Sato, Toshiaki Tanigaki, Mami Kurumada, Yoshio Saito, Chihiro Kaito

Research output: Contribution to journal › Article › peer-review

25 Citations (Scopus)

Abstract

Ultrafine particles of various metals [Cr, Mn, Fe, Al, Ni, Cu, In, Si, Ge, Zn, Mg and Sn], produced by the gas evaporation method were covered with the oxide layer of thickness less than 10 nm by exposure to air. In order to clarify the structure and thickness of the surface oxide layer on various metal ultrafine particles, high-resolution electron microscopy and infrared spectroscopy have been extensively used.

Original language	English
Pages (from-to)	7489-7492
Number of pages	4
Journal	Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
Volume	42
Issue number	12
DOIs	https://doi.org/10.1143/jjap.42.7489
Publication status	Published - 2003 Dec
Externally published	Yes

Keywords

HRTEM
IR spectra
Natural oxide
Thickness
Ultrafine particles

ASJC Scopus subject areas

Engineering(all)
Physics and Astronomy(all)

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10.1143/jjap.42.7489

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title = "Structure and Thickness of Natural Oxide Layer on Ultrafine Particle",

abstract = "Ultrafine particles of various metals [Cr, Mn, Fe, Al, Ni, Cu, In, Si, Ge, Zn, Mg and Sn], produced by the gas evaporation method were covered with the oxide layer of thickness less than 10 nm by exposure to air. In order to clarify the structure and thickness of the surface oxide layer on various metal ultrafine particles, high-resolution electron microscopy and infrared spectroscopy have been extensively used.",

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language = "English",

volume = "42",

pages = "7489--7492",

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T1 - Structure and Thickness of Natural Oxide Layer on Ultrafine Particle

AU - Tamura, Koichi

AU - Kimura, Yuki

AU - Suzuki, Hitoshi

AU - Kido, Osamu

AU - Sato, Takeshi

AU - Tanigaki, Toshiaki

AU - Kurumada, Mami

AU - Saito, Yoshio

AU - Kaito, Chihiro

PY - 2003/12

Y1 - 2003/12

N2 - Ultrafine particles of various metals [Cr, Mn, Fe, Al, Ni, Cu, In, Si, Ge, Zn, Mg and Sn], produced by the gas evaporation method were covered with the oxide layer of thickness less than 10 nm by exposure to air. In order to clarify the structure and thickness of the surface oxide layer on various metal ultrafine particles, high-resolution electron microscopy and infrared spectroscopy have been extensively used.

AB - Ultrafine particles of various metals [Cr, Mn, Fe, Al, Ni, Cu, In, Si, Ge, Zn, Mg and Sn], produced by the gas evaporation method were covered with the oxide layer of thickness less than 10 nm by exposure to air. In order to clarify the structure and thickness of the surface oxide layer on various metal ultrafine particles, high-resolution electron microscopy and infrared spectroscopy have been extensively used.

KW - HRTEM

KW - IR spectra

KW - Natural oxide

KW - Thickness

KW - Ultrafine particles

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JF - Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes

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ER -

Structure and Thickness of Natural Oxide Layer on Ultrafine Particle

Abstract

Keywords

ASJC Scopus subject areas

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