Abstract
An alumina (α-Al 2O 3) bicrystal with a (0 0 0 1)/[0 0 0 1] low-angle twist grain boundary was fabricated by bonding two (0 0 0 1) substrates at 1500 °C in air. Dislocation structures in the resultant grain boundary were extensively observed in plan view and cross-sectional direction by transmission electron microscopy (TEM). The grain boundary consisted of a hexagonal dislocation network of 1/3〈12̄10〉 basal screw dislocations and wavy belt structures. The atomic core structure of the screw dislocations was analyzed in end-on view by high-resolution TEM. It was evident that the 1/3〈12̄10〉 basal screw dislocation does not dissociate into partial dislocations, which is in contrast to the 1/3〈12̄10〉 basal edge dislocation that dissociates into 1/3〈11̄00〉 and 1/3〈01̄10〉 partial dislocations. Also, TEM observation revealed that the wavy belt structures correspond to planar voids. From the morphology of the planar voids, it is considered that they accommodate a slight tilt component of the boundary.
Original language | English |
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Pages (from-to) | 1293-1299 |
Number of pages | 7 |
Journal | Acta Materialia |
Volume | 60 |
Issue number | 3 |
DOIs | |
Publication status | Published - 2012 Feb |
Externally published | Yes |
Keywords
- Alumina (α-Al O )
- Sapphire
- Screw dislocation
- Transmission electron microscopy (TEM)
- Twist grain boundary
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Ceramics and Composites
- Polymers and Plastics
- Metals and Alloys