Abstract
X-ray photoelectron diffraction (XPD) patterns of In 3d core levels have been measured for the Si(001)-(4 × 3)-In surface. An R factor analysis with single-scattering and multiple-scattering simulations of In 3d XPD patterns was performed for three structural models proposed so far. Only the model proposed by surface X-ray diffraction [Appl. Surf. Sci. 123/124, 104 (1998)] appeared to give a reasonably small R factor when the geometric parameters were modified from the original ones.
| Original language | English |
|---|---|
| Pages (from-to) | 1097-1102 |
| Number of pages | 6 |
| Journal | Surface Review and Letters |
| Volume | 6 |
| Issue number | 6 |
| DOIs | |
| Publication status | Published - 1999 Dec |
ASJC Scopus subject areas
- Condensed Matter Physics
- Surfaces and Interfaces
- Surfaces, Coatings and Films
- Materials Chemistry