Study on scintillation properties of rare earth (Pr, Nd and Tm) activated Lu2SiO5

Daisuke Totsuka, Takayuki Yanagida, Yutaka Fujimoto, Yuui Yokota, Akira Yoshikawa

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

1 Citation (Scopus)

Abstract

Rare earth (Pr, Nd and Tm) doped Lu2SiO5 (LSO) single crystals were grown by the micro-pulling down (μ-PD) method. The concentrations were added 0.05, 0.10, and 0.25% of Pr, 0.10, 0.25, and 0.50% of Nd, 0.1, 1, 10, and 100% of Tm with respect to Lu, respectively. Optical and radiation measurements were carried out on the samples. Pr samples have a transparency of about 80% in visible wavelength range in all crystals. Intense absorptions related with Pr3+ 4f-5d transitions were observed peaking around 230, 255 nm, and weak absorptions due to 4f-4f transitions were detected around 450 nm. In radio luminescence spectra, emissions due to Pr3+ 5d-4f transition were observed peaking around 275 nm, 310 nm, and emissions due to 4f-4f transition were observed peaking around 500 nm. By pulse height analysis with gamma-ray excitation using 137Cs, Pr 0.1% doped sample showed the highest light yield of 2,800ph/MeV. In decay time measurements using different excitation energy (photo-luminescence, X- and gamma-ray), two different processes of 5d-4f emissions were found. Fast decay component corresponds to direct excitation of Pr3+ (4-6 ns) and slower component (25 ns) reflects the energy migration process from the host lattice to the emission center.

Original languageEnglish
Title of host publicationIEEE Nuclear Science Symposuim and Medical Imaging Conference, NSS/MIC 2010
Pages1292-1295
Number of pages4
DOIs
Publication statusPublished - 2010
Event2010 IEEE Nuclear Science Symposium, Medical Imaging Conference, NSS/MIC 2010 and 17th International Workshop on Room-Temperature Semiconductor X-ray and Gamma-ray Detectors, RTSD 2010 - Knoxville, TN, United States
Duration: 2010 Oct 302010 Nov 6

Publication series

NameIEEE Nuclear Science Symposium Conference Record
ISSN (Print)1095-7863

Conference

Conference2010 IEEE Nuclear Science Symposium, Medical Imaging Conference, NSS/MIC 2010 and 17th International Workshop on Room-Temperature Semiconductor X-ray and Gamma-ray Detectors, RTSD 2010
Country/TerritoryUnited States
CityKnoxville, TN
Period10/10/3010/11/6

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