TY - GEN
T1 - Study on the surface wave propagation in the diamond coated silicon
AU - Park, Seo Jin
AU - Kim, Jisu
AU - Park, Sang Hyun
AU - Son, Misung
AU - Kim, Young H.
AU - Abe, Toshihiko
AU - Takagi, Toshiyuki
PY - 2007
Y1 - 2007
N2 - When ultrasound propagates on the layered substrate, the phase and group velocities of surface wave are varied with the frequency, and dispersion which reflects properties of layered materials can be determined from the critical angles of surface wave for various frequencies. In the present work, broadband surface wave were generated by oblique incident, and wave reflected at the edge of specimen were detected by pulse-echo setup. Frequency components of detected signals were obtained by digital filtering, and Rayleigh critical angles were determined as a function of frequency. Three specimens with different coating thickness were interrogated and dispersion of surface wave was obtained. The leaky factors of surface wave were also considered. Results obtained in the present work show good agreements with previous works.
AB - When ultrasound propagates on the layered substrate, the phase and group velocities of surface wave are varied with the frequency, and dispersion which reflects properties of layered materials can be determined from the critical angles of surface wave for various frequencies. In the present work, broadband surface wave were generated by oblique incident, and wave reflected at the edge of specimen were detected by pulse-echo setup. Frequency components of detected signals were obtained by digital filtering, and Rayleigh critical angles were determined as a function of frequency. Three specimens with different coating thickness were interrogated and dispersion of surface wave was obtained. The leaky factors of surface wave were also considered. Results obtained in the present work show good agreements with previous works.
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U2 - 10.1109/ULTSYM.2007.576
DO - 10.1109/ULTSYM.2007.576
M3 - Conference contribution
AN - SCOPUS:48149111288
SN - 1424413834
SN - 9781424413836
T3 - Proceedings - IEEE Ultrasonics Symposium
SP - 2291
EP - 2294
BT - 2007 IEEE Ultrasonics Symposium Proceedings, IUS
T2 - 2007 IEEE Ultrasonics Symposium, IUS
Y2 - 28 October 2007 through 31 October 2007
ER -