Submicrometer single crystal diffractometry for highly accurate structure determination

Nobuhiro Yasuda, Yoshimitsu Fukuyama, Koshiro Toriumi, Shigeru Kimura, Masaki Takata

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

55 Citations (Scopus)

Abstract

Submicrometer single crystal diffractometry for highly accurate structure determination was developed using the extremely stable and highly brilliant synchrotron radiation from SPring-8. This was achieved using a microbeam focusing system and the submicrometer precision low-eccentric goniometer system. We demonstrated the structure analyses with 2×2×2μm3 cytidine, 600×600×300nm3 BaTiO3, and 1×1×1μm3 silicon. The observed structure factors of the silicon crystal were in agreement with the structure factors determined by the Pendellösung method and do not require absorption and extinction corrections.

Original languageEnglish
Title of host publicationSRI 2009 - The 10th International Conference on Synchrotron Radiation Instrumentation
Pages147-150
Number of pages4
DOIs
Publication statusPublished - 2010
Event10th International Conference on Synchrotron Radiation Instrumentation, SRI 2009 - Melbourne, VIC, Australia
Duration: 2009 Sept 272009 Oct 2

Publication series

NameAIP Conference Proceedings
Volume1234
ISSN (Print)0094-243X
ISSN (Electronic)1551-7616

Conference

Conference10th International Conference on Synchrotron Radiation Instrumentation, SRI 2009
Country/TerritoryAustralia
CityMelbourne, VIC
Period09/9/2709/10/2

Keywords

  • X-ray diffraction
  • focused X-ray beam
  • phase zone plate
  • single crystal structure analysis
  • structure factor

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