Abstract
We fabricated a two-dimensional subwavelength grating (SWG) on a GaSb substrate. The SWG was patterned by electronbeam lithography and etched by a fast atom beam with SF6 and Cl2 gases. The SWG consisted of tapered gratings with a 350-nm-period and a 1280-nm-deep groove. The reflectivity at wavelengths from 500 nm to 2300 nm was measured and compared with the results calculated on the basis of rigorous coupled-wave analysis (RCWA). At wavelengths from 500 nm to 2000 nm, the SWG decreased the reflection as much as 5 to 10% from the original value of approximately 40% of the GaSb substrate. The thermal stability of the SWG was also studied by measuring the reflection spectra of heated samples.
Original language | English |
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Pages (from-to) | 4020-4023 |
Number of pages | 4 |
Journal | Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers |
Volume | 42 |
Issue number | 6 B |
DOIs | |
Publication status | Published - 2003 Jun |
Keywords
- Antireflection
- Fast atom beam
- Rigorous coupled-wave analysis
- Subwavelength gratings
ASJC Scopus subject areas
- Engineering(all)
- Physics and Astronomy(all)