Suppression of charging effect on collagen fibrils utilizing a conductive probe in TEM

Satoshi Suzuki; Zentaro Akase; Daisuke Shindo; Hisatake Kondo

doi:10.1093/jmicro/dft003

Suppression of charging effect on collagen fibrils utilizing a conductive probe in TEM

Satoshi Suzuki, Zentaro Akase, Daisuke Shindo, Hisatake Kondo

Research output: Contribution to journal › Article › peer-review

1 Citation (Scopus)

Abstract

We investigate the effectiveness of utilizing a conductive probe for a transmission electron microscope (TEM) to suppress charging caused by electron irradiation. To do this, the electric field around a charged collagen fibril was visualized by electron holography and then quantitatively analyzed by computer simulations. The electric field changed noticeably when the conductive probe was moved near the specimen and charging was drastically suppressed when the conductive probe directly touched the charged specimen. The causes of the change in the electric field and suppression of charging are briefly discussed.

Original language	English
Pages (from-to)	451-455
Number of pages	5
Journal	Journal of Electron Microscopy
Volume	62
Issue number	4
DOIs	https://doi.org/10.1093/jmicro/dft003
Publication status	Published - 2013 Aug

Keywords

charging effect
electric field
electron holography
piezo drive
probe
secondary electron

ASJC Scopus subject areas

Instrumentation

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10.1093/jmicro/dft003

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title = "Suppression of charging effect on collagen fibrils utilizing a conductive probe in TEM",

abstract = "We investigate the effectiveness of utilizing a conductive probe for a transmission electron microscope (TEM) to suppress charging caused by electron irradiation. To do this, the electric field around a charged collagen fibril was visualized by electron holography and then quantitatively analyzed by computer simulations. The electric field changed noticeably when the conductive probe was moved near the specimen and charging was drastically suppressed when the conductive probe directly touched the charged specimen. The causes of the change in the electric field and suppression of charging are briefly discussed.",

keywords = "charging effect, electric field, electron holography, piezo drive, probe, secondary electron",

author = "Satoshi Suzuki and Zentaro Akase and Daisuke Shindo and Hisatake Kondo",

year = "2013",

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doi = "10.1093/jmicro/dft003",

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T1 - Suppression of charging effect on collagen fibrils utilizing a conductive probe in TEM

AU - Suzuki, Satoshi

AU - Akase, Zentaro

AU - Shindo, Daisuke

AU - Kondo, Hisatake

PY - 2013/8

Y1 - 2013/8

N2 - We investigate the effectiveness of utilizing a conductive probe for a transmission electron microscope (TEM) to suppress charging caused by electron irradiation. To do this, the electric field around a charged collagen fibril was visualized by electron holography and then quantitatively analyzed by computer simulations. The electric field changed noticeably when the conductive probe was moved near the specimen and charging was drastically suppressed when the conductive probe directly touched the charged specimen. The causes of the change in the electric field and suppression of charging are briefly discussed.

AB - We investigate the effectiveness of utilizing a conductive probe for a transmission electron microscope (TEM) to suppress charging caused by electron irradiation. To do this, the electric field around a charged collagen fibril was visualized by electron holography and then quantitatively analyzed by computer simulations. The electric field changed noticeably when the conductive probe was moved near the specimen and charging was drastically suppressed when the conductive probe directly touched the charged specimen. The causes of the change in the electric field and suppression of charging are briefly discussed.

KW - charging effect

KW - electric field

KW - electron holography

KW - piezo drive

KW - probe

KW - secondary electron

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JO - Microscopy (Oxford, England)

JF - Microscopy (Oxford, England)

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Suppression of charging effect on collagen fibrils utilizing a conductive probe in TEM

Abstract

Keywords

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