TY - GEN
T1 - Surface form metrology of micro-optics
AU - Xu, Bin
AU - Jia, Zhigang
AU - Li, Xinghui
AU - Chen, Yuan Liu
AU - Shimizu, Yuki
AU - Ito, So
AU - Gao, Wei
PY - 2013
Y1 - 2013
N2 - This keynote starts from an overview of micro-optics from fundamental functions, fabrication methods and applications in precision engineering and nanotechnology. State-of-the-art measuring systems for surface form metrology of microoptics with micro-structured surfaces, including diffractive micro-optics such as diffraction gratings and refractive micro-optics such as micro lenses and micro-lens arrays, are then be presented. The measuring systems introduced in the presentation are classified into scanning probe microscope-based systems, mechanical stylus profiling systems and optical evaluation systems. Related research activities carried out in the authors' group are also highlighted.
AB - This keynote starts from an overview of micro-optics from fundamental functions, fabrication methods and applications in precision engineering and nanotechnology. State-of-the-art measuring systems for surface form metrology of microoptics with micro-structured surfaces, including diffractive micro-optics such as diffraction gratings and refractive micro-optics such as micro lenses and micro-lens arrays, are then be presented. The measuring systems introduced in the presentation are classified into scanning probe microscope-based systems, mechanical stylus profiling systems and optical evaluation systems. Related research activities carried out in the authors' group are also highlighted.
KW - Diffractive micro-optics
KW - Metrology
KW - Micro-optics
KW - Optical evaluation system
KW - Refractive micro-optics
KW - Scanning probe microscope
KW - Stylus profiling system
KW - Surface form
UR - http://www.scopus.com/inward/record.url?scp=84881331801&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84881331801&partnerID=8YFLogxK
U2 - 10.1117/12.2019243
DO - 10.1117/12.2019243
M3 - Conference contribution
AN - SCOPUS:84881331801
SN - 9780819495679
T3 - Proceedings of SPIE - The International Society for Optical Engineering
BT - International Conference on Optics in Precision Engineering and Nanotechnology, icOPEN 2013
T2 - International Conference on Optics in Precision Engineering and Nanotechnology, icOPEN 2013
Y2 - 9 April 2013 through 11 April 2013
ER -