Colorless transparent platelet single crystals of a novel Eu 2-doped strontium silicon aluminum oxynitride, (Sr 0.94Eu 0.06)(Al 0.3Si 0.7) 4(N 0.8O 0.2) 6, were prepared at 1800 °C and 0.92 MPa of N 2. Fundamental reflections of electron and X-ray diffraction of the crystals were indexed with a face-centered orthorhombic unit cell (a=5.8061(5) Å, b=37.762(3) Å, c=9.5936(9) Å). Diffuse streaks elongated in the b-axis direction were observed around the fundamental reflections hkl with h=2n1 of the electron and X-ray diffraction, indicating stacking faults of (0 1 0)[1 0 0]/2. A crystal structure model without the stacking faults was obtained using the X-ray diffraction data of the fundamental reflections with the space group Fdd2. A SiN 4- tetrahedron double layer of [SiN 2] 2 and a Sr/Eu double layer of [(Sr 0.94Eu 0.06)Al 1.2Si 0.8N 0.8 O 1.2] 2 are stacked alternately along the b-axis direction. The title compound showed an emission with a peak wavelength of 490 nm under 334 nm excitation at room temperature.
- Aluminum silicon oxynitride
- Crystal structure elucidation
- Stacking faults