TY - JOUR
T1 - System of laser pump and synchrotron radiation probe microdiffraction to investigate optical recording process
AU - Yasuda, Nobuhiro
AU - Fukuyama, Yoshimitsu
AU - Kimura, Shigeru
AU - Ito, Kiminori
AU - Tanaka, Yoshihito
AU - Osawa, Hitoshi
AU - Matsunaga, Toshiyuki
AU - Kojima, Rie
AU - Hisada, Kazuya
AU - Tsuchino, Akio
AU - Birukawa, Masahiro
AU - Yamada, Noboru
AU - Sekiguchi, Koji
AU - Fujiie, Kazuhiko
AU - Kawakubo, Osamu
AU - Takata, Masaki
N1 - Funding Information:
Part of this work was supported by the Japan Science and Technology Agency, through a CREST research project. The synchrotron radiation experiments were carried out at the BL40XU of SPring-8 with the approval of the Japan Synchrotron Radiation Research Institute (Proposal Nos. 2009B1931, 2009B1991, 2010A0030, 2010B0030, 2011A0030, 2011B0030, 2012A0030, and 2012B0030).
PY - 2013/6
Y1 - 2013/6
N2 - We have developed a system of laser-pump and synchrotron radiation probe microdiffraction to investigate the phase-change process on a nanosecond time scale of Ge2Sb2Te5 film embedded in multi-layer structures, which corresponds to real optical recording media. The measurements were achieved by combining (i) the pump-laser system with a pulse width of 300 ps, (ii) a highly brilliant focused microbeam with wide peak-energy width (ΔE/E ∼ 2%) made by focusing helical undulator radiation without monochromatization, and (iii) a precise sample rotation stage to make repetitive measurements. We successfully detected a very weak time-resolved diffraction signal by using this system from 100-nm-thick Ge2Sb 2Te5 phase-change layers. This enabled us to find the dependence of the crystal-amorphous phase change process of the Ge 2Sb2Te5 layers on laser power.
AB - We have developed a system of laser-pump and synchrotron radiation probe microdiffraction to investigate the phase-change process on a nanosecond time scale of Ge2Sb2Te5 film embedded in multi-layer structures, which corresponds to real optical recording media. The measurements were achieved by combining (i) the pump-laser system with a pulse width of 300 ps, (ii) a highly brilliant focused microbeam with wide peak-energy width (ΔE/E ∼ 2%) made by focusing helical undulator radiation without monochromatization, and (iii) a precise sample rotation stage to make repetitive measurements. We successfully detected a very weak time-resolved diffraction signal by using this system from 100-nm-thick Ge2Sb 2Te5 phase-change layers. This enabled us to find the dependence of the crystal-amorphous phase change process of the Ge 2Sb2Te5 layers on laser power.
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U2 - 10.1063/1.4807858
DO - 10.1063/1.4807858
M3 - Article
AN - SCOPUS:84879987196
SN - 0034-6748
VL - 84
JO - Review of Scientific Instruments
JF - Review of Scientific Instruments
IS - 6
M1 - 063902
ER -