TEM observation on ferroelectric domain structures of PbTiO3 epitaxial films

Kenta Aoyagi, Takanori Kiguchi, Yoshitaka Ehara, Hiroshi Funakubo, Toyohiko J. Konno

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

The ferroelectric domain structure of PbTiO3 (PTO) films was investigated by using transmission electron microscopy (TEM). In the film with PTO/SrTiO3 (STO) structure, 180° domains are formed near the SrTiO3 (STO) substrate and the domain length of 180° domains is 100 nm. However, 180° domains are not formed in the film with Pt/PTO/SrRuO3 (SRO)/STO structure. These results show that 180° domains are formed in order to minimize depolarizing field energy, and that the domain length of 180° domains is determined by the competition among the depolarizing field energy, domain wall energy, Coulomb interaction and elastic interaction.

Original languageEnglish
Title of host publicationElectroceramics in Japan XIV
PublisherTrans Tech Publications Ltd
Pages179-182
Number of pages4
ISBN (Print)9783037851821
DOIs
Publication statusPublished - 2011

Publication series

NameKey Engineering Materials
Volume485
ISSN (Print)1013-9826
ISSN (Electronic)1662-9795

Keywords

  • Ferroelectric thin film
  • TEM

Fingerprint

Dive into the research topics of 'TEM observation on ferroelectric domain structures of PbTiO3 epitaxial films'. Together they form a unique fingerprint.

Cite this