Temperature controlled scanning nonlinear dielectric microscopy

K. Ohara, Y. Cho

Research output: Contribution to journalConference articlepeer-review


Scanning Nonlinear Dielectric Microscopy (SNDM) can obtain the linear and nonlinear dielectric constant distribution of dielectric and ferroelectric materials with sub-nanometer resolution. In this paper, we present the new type of SNDM which can control the sample temperature (80K-730K) in vacuum (less than 5×10-7 Torr), and its application to measure the surface polarization state on LiTaO3 single crystal.

Original languageEnglish
Pages (from-to)27-34
Number of pages8
JournalMaterials Research Society Symposium - Proceedings
Publication statusPublished - 2003
EventAdvanced data Storage Materials and Characterization Techniques - Boston, MA, United States
Duration: 2003 Dec 12004 Dec 4


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