TY - JOUR
T1 - Temperature controlled scanning nonlinear dielectric microscopy
AU - Ohara, K.
AU - Cho, Y.
PY - 2003
Y1 - 2003
N2 - Scanning Nonlinear Dielectric Microscopy (SNDM) can obtain the linear and nonlinear dielectric constant distribution of dielectric and ferroelectric materials with sub-nanometer resolution. In this paper, we present the new type of SNDM which can control the sample temperature (80K-730K) in vacuum (less than 5×10-7 Torr), and its application to measure the surface polarization state on LiTaO3 single crystal.
AB - Scanning Nonlinear Dielectric Microscopy (SNDM) can obtain the linear and nonlinear dielectric constant distribution of dielectric and ferroelectric materials with sub-nanometer resolution. In this paper, we present the new type of SNDM which can control the sample temperature (80K-730K) in vacuum (less than 5×10-7 Torr), and its application to measure the surface polarization state on LiTaO3 single crystal.
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U2 - 10.1557/proc-803-gg4.3
DO - 10.1557/proc-803-gg4.3
M3 - Conference article
AN - SCOPUS:2942674680
SN - 0272-9172
VL - 803
SP - 27
EP - 34
JO - Materials Research Society Symposium - Proceedings
JF - Materials Research Society Symposium - Proceedings
T2 - Advanced data Storage Materials and Characterization Techniques
Y2 - 1 December 2003 through 4 December 2004
ER -