Texture and transformation characteristics of Ni-Mn-Ga films deposited on alumina

Volodymyr Chernenko, Manfred Kohl, Stephen Doyle, Peter Müllner, Makoto Ohtsuka

Research output: Contribution to journalArticlepeer-review

34 Citations (Scopus)


X-ray diffraction mapping in synchrotron experiments shows a fiber texture in microcrystalline Ni-Mn-Ga films deposited and annealed on an alumina ceramic substrate. The texture scans do not reveal a significant in-plane orientation preference. Resistivity curves show that the onset of martensitic transformation depends non-monotonically on the film thickness. This dependence is correlated with the behavior of texture as a function of film thickness. A magnetic field-induced actuation is obtained for a film/substrate thickness ratio of 1/30.

Original languageEnglish
Pages (from-to)1287-1291
Number of pages5
JournalScripta Materialia
Issue number7
Publication statusPublished - 2006 Apr


  • Martensitic phase transformation
  • Ni-Mn-Ga Heusler alloy
  • Texture
  • Thin films


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