Texture and transformation characteristics of Ni-Mn-Ga films deposited on alumina

Volodymyr Chernenko; Manfred Kohl; Stephen Doyle; Peter Müllner; Makoto Ohtsuka

doi:10.1016/j.scriptamat.2005.12.020

Texture and transformation characteristics of Ni-Mn-Ga films deposited on alumina

Volodymyr Chernenko, Manfred Kohl, Stephen Doyle, Peter Müllner, Makoto Ohtsuka

IMRAM - Center for Mineral Processing and Metallurgy (CMPM)

Research output: Contribution to journal › Article › peer-review

34 Citations (Scopus)

Abstract

X-ray diffraction mapping in synchrotron experiments shows a fiber texture in microcrystalline Ni-Mn-Ga films deposited and annealed on an alumina ceramic substrate. The texture scans do not reveal a significant in-plane orientation preference. Resistivity curves show that the onset of martensitic transformation depends non-monotonically on the film thickness. This dependence is correlated with the behavior of texture as a function of film thickness. A magnetic field-induced actuation is obtained for a film/substrate thickness ratio of 1/30.

Original language	English
Pages (from-to)	1287-1291
Number of pages	5
Journal	Scripta Materialia
Volume	54
Issue number	7
DOIs	https://doi.org/10.1016/j.scriptamat.2005.12.020
Publication status	Published - 2006 Apr

Keywords

Martensitic phase transformation
Ni-Mn-Ga Heusler alloy
Texture
Thin films

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10.1016/j.scriptamat.2005.12.020

Cite this

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title = "Texture and transformation characteristics of Ni-Mn-Ga films deposited on alumina",

abstract = "X-ray diffraction mapping in synchrotron experiments shows a fiber texture in microcrystalline Ni-Mn-Ga films deposited and annealed on an alumina ceramic substrate. The texture scans do not reveal a significant in-plane orientation preference. Resistivity curves show that the onset of martensitic transformation depends non-monotonically on the film thickness. This dependence is correlated with the behavior of texture as a function of film thickness. A magnetic field-induced actuation is obtained for a film/substrate thickness ratio of 1/30.",

keywords = "Martensitic phase transformation, Ni-Mn-Ga Heusler alloy, Texture, Thin films",

author = "Volodymyr Chernenko and Manfred Kohl and Stephen Doyle and Peter M{\"u}llner and Makoto Ohtsuka",

note = "Funding Information: VAC is grateful to the IMT and the ANKA facility at Forschungszentrum Karlsruhe for providing financial support and synchrotron beam time in a framework of proposals DIFF_04_002; MS-12. VAC is also grateful to BSU for financial support. The authors are grateful to M. Chmielus for assisting in data processing. This research was partially funded under DARPA contract N660001-01-8034. ",

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doi = "10.1016/j.scriptamat.2005.12.020",

language = "English",

volume = "54",

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journal = "Scripta Materialia",

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T1 - Texture and transformation characteristics of Ni-Mn-Ga films deposited on alumina

AU - Chernenko, Volodymyr

AU - Kohl, Manfred

AU - Doyle, Stephen

AU - Müllner, Peter

AU - Ohtsuka, Makoto

N1 - Funding Information: VAC is grateful to the IMT and the ANKA facility at Forschungszentrum Karlsruhe for providing financial support and synchrotron beam time in a framework of proposals DIFF_04_002; MS-12. VAC is also grateful to BSU for financial support. The authors are grateful to M. Chmielus for assisting in data processing. This research was partially funded under DARPA contract N660001-01-8034.

PY - 2006/4

Y1 - 2006/4

N2 - X-ray diffraction mapping in synchrotron experiments shows a fiber texture in microcrystalline Ni-Mn-Ga films deposited and annealed on an alumina ceramic substrate. The texture scans do not reveal a significant in-plane orientation preference. Resistivity curves show that the onset of martensitic transformation depends non-monotonically on the film thickness. This dependence is correlated with the behavior of texture as a function of film thickness. A magnetic field-induced actuation is obtained for a film/substrate thickness ratio of 1/30.

AB - X-ray diffraction mapping in synchrotron experiments shows a fiber texture in microcrystalline Ni-Mn-Ga films deposited and annealed on an alumina ceramic substrate. The texture scans do not reveal a significant in-plane orientation preference. Resistivity curves show that the onset of martensitic transformation depends non-monotonically on the film thickness. This dependence is correlated with the behavior of texture as a function of film thickness. A magnetic field-induced actuation is obtained for a film/substrate thickness ratio of 1/30.

KW - Martensitic phase transformation

KW - Ni-Mn-Ga Heusler alloy

KW - Texture

KW - Thin films

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SP - 1287

EP - 1291

JO - Scripta Materialia

JF - Scripta Materialia

IS - 7

ER -

Texture and transformation characteristics of Ni-Mn-Ga films deposited on alumina

Abstract

Keywords

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