The enhancement of magnetic damping in Fe4N films with increasing thickness

Shinji Isogami; Masakiyo Tsunoda; Mikihiko Oogane; Akimasa Sakuma; Migaku Takahashi

doi:10.7567/JJAP.52.073001

The enhancement of magnetic damping in Fe₄N films with increasing thickness

Shinji Isogami, Masakiyo Tsunoda, Mikihiko Oogane, Akimasa Sakuma, Migaku Takahashi

Research output: Contribution to journal › Article › peer-review

5 Citations (Scopus)

Abstract

The film thickness dependence of the magnetic damping coefficient (α) was investigated by measuring the ferromagnetic resonance (FMR) of Fe ₄N/NM (NM: Pt and Cu) bilayer films at room temperature. We observed that α in Fe₄N/Pt films increased with increasing Fe ₄N film thickness. Moreover, the enhancement of α, which is represented by the difference in the α values of Fe₄N/Pt and Fe₄N/Cu films, also increased as the Fe₄N film thickness increased. The behavior observed in the Fe₄N system was the opposite of that observed for the conventional Ni-Fe system. We speculated two mechanisms occurring in Fe₄N/Pt films, which are less magnetic and/or nonmagnetic impurities in the Fe₄N films and enhancement of the coercive force (Hc) with increasing Fe₄N film thickness.

Original language	English
Article number	073001
Journal	Japanese journal of applied physics
Volume	52
Issue number	7 PART 1
DOIs	https://doi.org/10.7567/JJAP.52.073001
Publication status	Published - 2013 Jan

ASJC Scopus subject areas

Engineering(all)
Physics and Astronomy(all)

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abstract = "The film thickness dependence of the magnetic damping coefficient (α) was investigated by measuring the ferromagnetic resonance (FMR) of Fe 4N/NM (NM: Pt and Cu) bilayer films at room temperature. We observed that α in Fe4N/Pt films increased with increasing Fe 4N film thickness. Moreover, the enhancement of α, which is represented by the difference in the α values of Fe4N/Pt and Fe4N/Cu films, also increased as the Fe4N film thickness increased. The behavior observed in the Fe4N system was the opposite of that observed for the conventional Ni-Fe system. We speculated two mechanisms occurring in Fe4N/Pt films, which are less magnetic and/or nonmagnetic impurities in the Fe4N films and enhancement of the coercive force (Hc) with increasing Fe4N film thickness.",

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T1 - The enhancement of magnetic damping in Fe4N films with increasing thickness

AU - Isogami, Shinji

AU - Tsunoda, Masakiyo

AU - Oogane, Mikihiko

AU - Sakuma, Akimasa

AU - Takahashi, Migaku

PY - 2013/1

Y1 - 2013/1

N2 - The film thickness dependence of the magnetic damping coefficient (α) was investigated by measuring the ferromagnetic resonance (FMR) of Fe 4N/NM (NM: Pt and Cu) bilayer films at room temperature. We observed that α in Fe4N/Pt films increased with increasing Fe 4N film thickness. Moreover, the enhancement of α, which is represented by the difference in the α values of Fe4N/Pt and Fe4N/Cu films, also increased as the Fe4N film thickness increased. The behavior observed in the Fe4N system was the opposite of that observed for the conventional Ni-Fe system. We speculated two mechanisms occurring in Fe4N/Pt films, which are less magnetic and/or nonmagnetic impurities in the Fe4N films and enhancement of the coercive force (Hc) with increasing Fe4N film thickness.

AB - The film thickness dependence of the magnetic damping coefficient (α) was investigated by measuring the ferromagnetic resonance (FMR) of Fe 4N/NM (NM: Pt and Cu) bilayer films at room temperature. We observed that α in Fe4N/Pt films increased with increasing Fe 4N film thickness. Moreover, the enhancement of α, which is represented by the difference in the α values of Fe4N/Pt and Fe4N/Cu films, also increased as the Fe4N film thickness increased. The behavior observed in the Fe4N system was the opposite of that observed for the conventional Ni-Fe system. We speculated two mechanisms occurring in Fe4N/Pt films, which are less magnetic and/or nonmagnetic impurities in the Fe4N films and enhancement of the coercive force (Hc) with increasing Fe4N film thickness.

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The enhancement of magnetic damping in Fe₄N films with increasing thickness

Abstract

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