The local structure around Ge atoms in Ge-doped magnetite thin films

Kozo Shinoda, Seishi Abe, Kazumasa Sugiyama, Yoshio Waseda

Research output: Contribution to journalArticlepeer-review

2 Citations (Scopus)


Distribution of Ge atoms between tetrahedral and octahedral sites in the spinel-type structure of Fe2.64Ge0.36O4 thin films fabricated by radio frequency sputtering with a composite target of magnetite and Ge has been investigated by extended X-ray absorption fine structure analysis. The local structural changes around the Ge atoms in the films induced by annealing at 573 and 873 K are discussed through comparison of the local structure for sintered crystalline Fe2.7Ge0.3O4 in which Ge atoms preferentially located at the tetrahedral site of the spinel-type structure. This work provides successful information on the structural change with magnetic property of the thin films as follows: the Ge atoms statistically distributed at the tetrahedral and octahedral sites of the as-synthesized films and preferentially occupied the tetrahedral site by annealing at 873 K corresponding to the increase in magnetization.

Original languageEnglish
Pages (from-to)645-662
Number of pages18
JournalHigh Temperature Materials and Processes
Issue number1
Publication statusPublished - 2020 Jan 1


  • single crystal X-ray diffraction
  • site distribution
  • spinel-type structure
  • X-ray absorption spectroscopy


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