Abstract
The measurement of oxygen flux across nanocrystalline cerium oxide (Ce O2) thin films at intermediate temperature (650-800°C) is presented. Porous ceria support substrates were fabricated by sintering with carbon additions. The final dense film was deposited from an optimized sol-gel solution resulting in a mean grain size of 50 nm, which displayed oxygen flux values of up to 0.014 μ mol/ cm2 s over the oxygen partial pressure range from air to helium gas used in the measurement at 800°C. The oxygen flux characteristics confirm mixed ionic and electronic conductivities in nanocrystalline ceria films and demonstrate the role of size dependent materials properties as a design parameter in functional membranes for oxygen separation.
Original language | English |
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Pages (from-to) | B1852-B1857 |
Journal | Journal of the Electrochemical Society |
Volume | 157 |
Issue number | 12 |
DOIs | |
Publication status | Published - 2010 |