The structure of MCM-48 determined by electron crystallography

Anna Carlsson; Mizue Kaneda; Yasuhiro Sakamoto; Osamu Terasaki; Ryong Ryoo; Sang Hoon Joo

doi:10.1093/oxfordjournals.jmicro.a023751

The structure of MCM-48 determined by electron crystallography

Anna Carlsson, Mizue Kaneda, Yasuhiro Sakamoto, Osamu Terasaki, Ryong Ryoo, Sang Hoon Joo

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Abstract

The structure of the amorphous walls of the mesoporous material MCM-48 was investigated with a combination of high-resolution transmission electron microscopy and selected area electron diffraction, and the three-dimensional structure was reconstructed by electron crystallography. The crystals were well ordered over large areas as shown by the images and diffraction patterns. It was firmly confirmed from Fourier transforms of thin areas that MCM-48 belongs to the Ia3d space group and that the amorphous walls roughly follow the gyroid surface (a minimal surface), but the wall thickness is not uniform.

Original language	English
Pages (from-to)	795-798
Number of pages	4
Journal	Journal of Electron Microscopy
Volume	48
Issue number	6
DOIs	https://doi.org/10.1093/oxfordjournals.jmicro.a023751
Publication status	Published - 1999

Keywords

Electron crystallography
HRTEM
Image processing
MCM-48
Mesoporous materials
Structure determination

ASJC Scopus subject areas

Instrumentation

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10.1093/oxfordjournals.jmicro.a023751

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title = "The structure of MCM-48 determined by electron crystallography",

abstract = "The structure of the amorphous walls of the mesoporous material MCM-48 was investigated with a combination of high-resolution transmission electron microscopy and selected area electron diffraction, and the three-dimensional structure was reconstructed by electron crystallography. The crystals were well ordered over large areas as shown by the images and diffraction patterns. It was firmly confirmed from Fourier transforms of thin areas that MCM-48 belongs to the Ia3d space group and that the amorphous walls roughly follow the gyroid surface (a minimal surface), but the wall thickness is not uniform.",

keywords = "Electron crystallography, HRTEM, Image processing, MCM-48, Mesoporous materials, Structure determination",

author = "Anna Carlsson and Mizue Kaneda and Yasuhiro Sakamoto and Osamu Terasaki and Ryong Ryoo and Joo, {Sang Hoon}",

note = "Funding Information: CREST, JST is acknowledged for financial support. AC is grateful suppon from JSPS.",

year = "1999",

doi = "10.1093/oxfordjournals.jmicro.a023751",

language = "English",

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journal = "Microscopy (Oxford, England)",

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TY - JOUR

T1 - The structure of MCM-48 determined by electron crystallography

AU - Carlsson, Anna

AU - Kaneda, Mizue

AU - Sakamoto, Yasuhiro

AU - Terasaki, Osamu

AU - Ryoo, Ryong

AU - Joo, Sang Hoon

N1 - Funding Information: CREST, JST is acknowledged for financial support. AC is grateful suppon from JSPS.

PY - 1999

Y1 - 1999

N2 - The structure of the amorphous walls of the mesoporous material MCM-48 was investigated with a combination of high-resolution transmission electron microscopy and selected area electron diffraction, and the three-dimensional structure was reconstructed by electron crystallography. The crystals were well ordered over large areas as shown by the images and diffraction patterns. It was firmly confirmed from Fourier transforms of thin areas that MCM-48 belongs to the Ia3d space group and that the amorphous walls roughly follow the gyroid surface (a minimal surface), but the wall thickness is not uniform.

AB - The structure of the amorphous walls of the mesoporous material MCM-48 was investigated with a combination of high-resolution transmission electron microscopy and selected area electron diffraction, and the three-dimensional structure was reconstructed by electron crystallography. The crystals were well ordered over large areas as shown by the images and diffraction patterns. It was firmly confirmed from Fourier transforms of thin areas that MCM-48 belongs to the Ia3d space group and that the amorphous walls roughly follow the gyroid surface (a minimal surface), but the wall thickness is not uniform.

KW - Electron crystallography

KW - HRTEM

KW - Image processing

KW - MCM-48

KW - Mesoporous materials

KW - Structure determination

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U2 - 10.1093/oxfordjournals.jmicro.a023751

DO - 10.1093/oxfordjournals.jmicro.a023751

M3 - Article

AN - SCOPUS:0033492589

SN - 2050-5698

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EP - 798

JO - Microscopy (Oxford, England)

JF - Microscopy (Oxford, England)

IS - 6

ER -

The structure of MCM-48 determined by electron crystallography

Abstract

Keywords

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