TY - JOUR
T1 - Theory of interface resistances
AU - Schep, K. M.
AU - Van Hoof, J. B.A.N.
AU - Kelly, P. J.
AU - Bauer, G. E.W.
AU - Inglesfield, J. E.
N1 - Funding Information:
This work is part of the research program of the Stichting voor Fundamenteel Onderzoek der Materie (FOM), which is financially supported by the Neder-landse Organisatie voor Wetenschappelijk Onderzoek (NWO). We acknowledge benefits from the TMR Research Network on 'Interface Magnetism' under contract no. FMRX-CT96-0089 (DG12-MIHT).
PY - 1998/1
Y1 - 1998/1
N2 - The interface resistances of magnetic multilayers are calculated without any adjustable parameters by combining first-principles electronic structure calculations with the Boltzmann equation. The microscopic mechanism of specular interface scattering in combination with diffuse bulk scattering can largely explain the experimentally observed values for the interface resistances of Co/Cu multilayers.
AB - The interface resistances of magnetic multilayers are calculated without any adjustable parameters by combining first-principles electronic structure calculations with the Boltzmann equation. The microscopic mechanism of specular interface scattering in combination with diffuse bulk scattering can largely explain the experimentally observed values for the interface resistances of Co/Cu multilayers.
KW - Electrical transport
KW - Electronic structure
KW - Interface resistance
KW - Magnetoresistance - giant
KW - Magnetoresistance - theory
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U2 - 10.1016/S0304-8853(97)00749-X
DO - 10.1016/S0304-8853(97)00749-X
M3 - Article
AN - SCOPUS:0031682044
SN - 0304-8853
VL - 177-181
SP - 1166
EP - 1167
JO - Journal of Magnetism and Magnetic Materials
JF - Journal of Magnetism and Magnetic Materials
IS - PART 2
ER -