Thermal analysis of laser-emission surface-normal optical devices with a vertical cavity

Laser-emission surface-normal optical devices with a vertical cavity are expected to be key devices for optical interconnections. Thermal characteristics improvement is necessary for a large-scale-integrated two-dimensional array which increases the number of optical interconnections. To optimize the device structures to obtain good thermal characteristics, the temperature rise of distributed Bragg reflectors and an active layer must be known. Here, we report on the first evaluation of temperature rise in both regions, and it is found that the temperature rise is small for a compact double-mesa structure which allows a single lateral-mode oscillation. In addition, we measured the thermal crosstalk between the above compact devices, and it is found that the thermal crosstalk between one-dimensional array devices is small enough when each device operates at a few milliamperes.