TY - JOUR
T1 - Thermal phase transformation of ZnO-based transparent ferromagnetic composite films and the change in magnetic characteristics
AU - Shinagawa, Tsutomu
AU - Izaki, Masanobu
AU - Murase, Kuniaki
AU - Uruga, Tomoya
AU - Nakamura, Tetsuya
AU - Matsumura, Yasuyuki
AU - Awakura, Yasuhiro
PY - 2006
Y1 - 2006
N2 - Transparent ferromagnetic semiconducting composite Fe-Zn-O films composed of wurtzite ZnO matrix and Zn-incorporated magnetite particles have been prepared by novel chemical solution processes followed by thermal annealing, performed at different temperatures between 200 and 700°C under vacuum at around 5× 10-4 Pa. The effects of the thermal annealing on the structure and magnetic, electrical, and optical properties of the heterogranular transition metal oxides (Fe-Zn-O) films have been studied by using X-ray diffraction, X-ray absorption fine structure (XAFS), vibrating sample magnetometer, soft X-ray magnetic circular dichroism (SXMCD), and so on. These properties strongly depended on the annealing temperature and could be correlated to the changes in the ZnO matrix and/or the Zn-incorporated magnetite phase. The XAFS and SXMCD measurements using synchrotron radiation elucidated the growth process of the Zn-incorporated magnetite phase in the ZnO matrix.
AB - Transparent ferromagnetic semiconducting composite Fe-Zn-O films composed of wurtzite ZnO matrix and Zn-incorporated magnetite particles have been prepared by novel chemical solution processes followed by thermal annealing, performed at different temperatures between 200 and 700°C under vacuum at around 5× 10-4 Pa. The effects of the thermal annealing on the structure and magnetic, electrical, and optical properties of the heterogranular transition metal oxides (Fe-Zn-O) films have been studied by using X-ray diffraction, X-ray absorption fine structure (XAFS), vibrating sample magnetometer, soft X-ray magnetic circular dichroism (SXMCD), and so on. These properties strongly depended on the annealing temperature and could be correlated to the changes in the ZnO matrix and/or the Zn-incorporated magnetite phase. The XAFS and SXMCD measurements using synchrotron radiation elucidated the growth process of the Zn-incorporated magnetite phase in the ZnO matrix.
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U2 - 10.1149/1.2147036
DO - 10.1149/1.2147036
M3 - Article
AN - SCOPUS:30644473138
SN - 0013-4651
VL - 153
SP - G168-G174
JO - Journal of the Electrochemical Society
JF - Journal of the Electrochemical Society
IS - 2
ER -