Thermoelectric properties and phase transition of (ZnxCu 2-x)V2O7

Kotaro Sotojima, Ryosuke O. Suzuki, Koji Amezawa, Yoichi Tomii

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7 Citations (Scopus)


The phase stability and thermoelectric properties of the layered structure of (ZnxCu2-x)V2O7 solid solutions were studied for x ≥ 0.2. X-ray diffraction measurements, compositional studies, and thermal analysis verified that the low-temperature form of the (ZnxCu2-x)V2O7 solid solution (monoclinic structure, C2/c) was stable for 0.2 ≤ x ≤ 2 when heated below 863 K in air. On heating, phase transformation occurred at least at 0.2 ≤ x ≤ 2 at a nearly constant temperature of approximately 873 K; above this temperature, a high-temperature form of the (ZnxCu 2-x)V2O7 solid solution was formed. The Seebeck coefficients of the low-temperature (ZnxCu2-x)V 2O7 solid solution exhibited large negative values in the range of approximately -520 to -700μV/K, and the electrical resistivity increased with Zn addition. The maximum power factor of 1.99 × 10 -7 W/ m K2 was obtained at 823 K for the low-temperature form of the (Zn0.2Cu1.8)V2O7 solid solution.

Original languageEnglish
Pages (from-to)2094-2099
Number of pages6
JournalMaterials Transactions
Issue number8
Publication statusPublished - 2007 Aug


  • Electrical resistivity
  • Layered structure
  • Phase diagram
  • Seebeck coefficient
  • Vanadium oxide


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