Thickness dependence of transformation characteristics of Ni-Mn-Ga thin films deposited on alumina: Experiment and modeling

V. A. Chernenko; M. Kohl; M. Ohtsuka; T. Takagi; V. A. L'vov; V. M. Kniazkyi

doi:10.1016/j.msea.2006.02.055

Thickness dependence of transformation characteristics of Ni-Mn-Ga thin films deposited on alumina: Experiment and modeling

V. A. Chernenko, M. Kohl, M. Ohtsuka, T. Takagi, V. A. L'vov, V. M. Kniazkyi

Research output: Contribution to journal › Article › peer-review

23 Citations (Scopus)

Abstract

A thickness dependence of the martensitic transformation temperature is experimentally found in submicrometer Ni-Mn-Ga films deposited and annealed on alumina substrate. A theoretical description of the stress state of these films originating from the particular martensitic microstructure and elastic interaction between film and substrate is developed. Experimental results are in a satisfactory agreement with the theoretical estimations.

Original language	English
Pages (from-to)	944-947
Number of pages	4
Journal	Materials Science & Engineering A: Structural Materials: Properties, Microstructure and Processing
Volume	438-440
Issue number	SPEC. ISS.
DOIs	https://doi.org/10.1016/j.msea.2006.02.055
Publication status	Published - 2006 Nov 25

Keywords

Alumina substrate
Martensitic transformation temperatures
Modeling
Ni-Mn-Ga thin films
Resistivity

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10.1016/j.msea.2006.02.055

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Chernenko, V. A., Kohl, M., Ohtsuka, M., Takagi, T., L'vov, V. A., & Kniazkyi, V. M. (2006). Thickness dependence of transformation characteristics of Ni-Mn-Ga thin films deposited on alumina: Experiment and modeling. Materials Science & Engineering A: Structural Materials: Properties, Microstructure and Processing, 438-440(SPEC. ISS.), 944-947. https://doi.org/10.1016/j.msea.2006.02.055

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title = "Thickness dependence of transformation characteristics of Ni-Mn-Ga thin films deposited on alumina: Experiment and modeling",

abstract = "A thickness dependence of the martensitic transformation temperature is experimentally found in submicrometer Ni-Mn-Ga films deposited and annealed on alumina substrate. A theoretical description of the stress state of these films originating from the particular martensitic microstructure and elastic interaction between film and substrate is developed. Experimental results are in a satisfactory agreement with the theoretical estimations.",

keywords = "Alumina substrate, Martensitic transformation temperatures, Modeling, Ni-Mn-Ga thin films, Resistivity",

author = "Chernenko, {V. A.} and M. Kohl and M. Ohtsuka and T. Takagi and L'vov, {V. A.} and Kniazkyi, {V. M.}",

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Chernenko, VA, Kohl, M, Ohtsuka, M , Takagi, T, L'vov, VA & Kniazkyi, VM 2006, 'Thickness dependence of transformation characteristics of Ni-Mn-Ga thin films deposited on alumina: Experiment and modeling', Materials Science & Engineering A: Structural Materials: Properties, Microstructure and Processing, vol. 438-440, no. SPEC. ISS., pp. 944-947. https://doi.org/10.1016/j.msea.2006.02.055

Thickness dependence of transformation characteristics of Ni-Mn-Ga thin films deposited on alumina: Experiment and modeling. / Chernenko, V. A.; Kohl, M.; Ohtsuka, M. et al.
In: Materials Science & Engineering A: Structural Materials: Properties, Microstructure and Processing, Vol. 438-440, No. SPEC. ISS., 25.11.2006, p. 944-947.

Research output: Contribution to journal › Article › peer-review

TY - JOUR

T1 - Thickness dependence of transformation characteristics of Ni-Mn-Ga thin films deposited on alumina

T2 - Experiment and modeling

AU - Chernenko, V. A.

AU - Kohl, M.

AU - Ohtsuka, M.

AU - Takagi, T.

AU - L'vov, V. A.

AU - Kniazkyi, V. M.

PY - 2006/11/25

Y1 - 2006/11/25

N2 - A thickness dependence of the martensitic transformation temperature is experimentally found in submicrometer Ni-Mn-Ga films deposited and annealed on alumina substrate. A theoretical description of the stress state of these films originating from the particular martensitic microstructure and elastic interaction between film and substrate is developed. Experimental results are in a satisfactory agreement with the theoretical estimations.

AB - A thickness dependence of the martensitic transformation temperature is experimentally found in submicrometer Ni-Mn-Ga films deposited and annealed on alumina substrate. A theoretical description of the stress state of these films originating from the particular martensitic microstructure and elastic interaction between film and substrate is developed. Experimental results are in a satisfactory agreement with the theoretical estimations.

KW - Alumina substrate

KW - Martensitic transformation temperatures

KW - Modeling

KW - Ni-Mn-Ga thin films

KW - Resistivity

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U2 - 10.1016/j.msea.2006.02.055

DO - 10.1016/j.msea.2006.02.055

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SN - 0921-5093

VL - 438-440

SP - 944

EP - 947

JO - Materials Science & Engineering A: Structural Materials: Properties, Microstructure and Processing

JF - Materials Science & Engineering A: Structural Materials: Properties, Microstructure and Processing

IS - SPEC. ISS.

ER -

Thickness dependence of transformation characteristics of Ni-Mn-Ga thin films deposited on alumina: Experiment and modeling

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Keywords

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