A thickness dependence of the martensitic transformation temperature is experimentally found in submicrometer Ni-Mn-Ga films deposited and annealed on alumina substrate. A theoretical description of the stress state of these films originating from the particular martensitic microstructure and elastic interaction between film and substrate is developed. Experimental results are in a satisfactory agreement with the theoretical estimations.
|Number of pages||4|
|Journal||Materials Science & Engineering A: Structural Materials: Properties, Microstructure and Processing|
|Issue number||SPEC. ISS.|
|Publication status||Published - 2006 Nov 25|
- Alumina substrate
- Martensitic transformation temperatures
- Ni-Mn-Ga thin films