TY - JOUR
T1 - Thickness dependencies of structural and magnetic properties of cubic and tetragonal Heusler alloy bilayer films
AU - Ranjbar, R.
AU - Suzuki, K. Z.
AU - Sugihara, A.
AU - Ando, Y.
AU - Miyazaki, T.
AU - Mizukami, S.
N1 - Funding Information:
This work was partially supported by the Advanced Spintronic Materials and Transport Phenomena-Japan Science and Technology Agency (ASPIMATT-JST), Grants-in-Aid for Scientific Research (No. 16K14244) and Asahi Glass Foundation. R. Ranjbar also thanks Y. Kondo for technical assistance and the WPI program, and acknowledges a JGC-S scholarship (Nikki).
Publisher Copyright:
© 2017 Elsevier B.V.
PY - 2017/7/1
Y1 - 2017/7/1
N2 - The thickness dependencies of the structural and magnetic properties for bilayers of cubic Co-based Heusler alloys (CCHAs: Co2FeAl (CFA), Co2FeSi (CFS), Co2MnAl (CMA), and Co2MnSi (CMS)) and D022-MnGa were investigated. Epitaxy of the B2 structure of CCHAs on a MnGa film was achieved; the smallest thickness with the B2 structure was found for 3-nm-thick CMS and CFS. The interfacial exchange coupling (Jex) was antiferromagnetic (AFM) for all of the CCHAs/MnGa bilayers except for unannealed CFA/MnGa samples. A critical thickness (tcrit) at which perpendicular magnetization appears of approximately 4–10 nm for the CMA/MnGa and CMS/MnGa bilayers was observed, whereas this thickness was 1–3 nm for the CFA/MnGa and CFS/MnGa films. The critical thickness for different CCHAs materials is discussed in terms of saturation magnetization (Ms) and the Jex.
AB - The thickness dependencies of the structural and magnetic properties for bilayers of cubic Co-based Heusler alloys (CCHAs: Co2FeAl (CFA), Co2FeSi (CFS), Co2MnAl (CMA), and Co2MnSi (CMS)) and D022-MnGa were investigated. Epitaxy of the B2 structure of CCHAs on a MnGa film was achieved; the smallest thickness with the B2 structure was found for 3-nm-thick CMS and CFS. The interfacial exchange coupling (Jex) was antiferromagnetic (AFM) for all of the CCHAs/MnGa bilayers except for unannealed CFA/MnGa samples. A critical thickness (tcrit) at which perpendicular magnetization appears of approximately 4–10 nm for the CMA/MnGa and CMS/MnGa bilayers was observed, whereas this thickness was 1–3 nm for the CFA/MnGa and CFS/MnGa films. The critical thickness for different CCHAs materials is discussed in terms of saturation magnetization (Ms) and the Jex.
KW - Cubic Co-based Heusler alloys
KW - Interfacial exchange coupling
KW - MnGa film
KW - Synthetic ferrimagnetic
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U2 - 10.1016/j.jmmm.2017.03.018
DO - 10.1016/j.jmmm.2017.03.018
M3 - Article
AN - SCOPUS:85015425678
SN - 0304-8853
VL - 433
SP - 195
EP - 201
JO - Journal of Magnetism and Magnetic Materials
JF - Journal of Magnetism and Magnetic Materials
ER -