Thickness dependent electronic structure of La0.6Sr 0.4MnO3 layer in SrTiO3/La0.6Sr 0.4MnO3/SrTiO3 heterostructures studied by hard x-ray photoemission spectroscopy

K. Yoshimatsu, K. Horiba, H. Kumigashira, E. Ikenaga, M. Oshima

Research output: Contribution to journalArticlepeer-review

15 Citations (Scopus)

Abstract

The authors have investigated changes in the electronic structures of digitally controlled La0.6Sr0.4MnO3 (LSMO) layers sandwiched between SrTiO3 as a function of LSMO layer thickness in terms of hard x-ray photoemission spectroscopy (HX-PES). The HX-PES spectra show the evolution of Mn 3d derived states near the Fermi level and the occurrence of metal-insulator transition at 8 ML. The detailed analysis for the thickness dependent HX-PES spectra reveals the existence of the less conducting and nonmagnetic transition layer with a film thickness of about 4 ML in the interface region owing to significant interaction through the interface.

Original languageEnglish
Article number071901
JournalApplied Physics Letters
Volume94
Issue number7
DOIs
Publication statusPublished - 2009
Externally publishedYes

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

Fingerprint

Dive into the research topics of 'Thickness dependent electronic structure of La0.6Sr 0.4MnO3 layer in SrTiO3/La0.6Sr 0.4MnO3/SrTiO3 heterostructures studied by hard x-ray photoemission spectroscopy'. Together they form a unique fingerprint.

Cite this