Three-dimensional structural image of Zn0.4Mn0.6Te diluted magnetic semiconductor obtained by X-ray fluorescence holography

S. Hosokawa, N. Happo, K. Hayashi

Research output: Contribution to journalArticlepeer-review

1 Citation (Scopus)

Abstract

An X-ray fluorescence holography (XFH) measurement was performed at the beamline BL-3A in the Photon Factory to visualize the three-dimensional local atomic image around the Zn atoms in a diluted magnetic semiconductor Zn0.4Mn0.6Te. The nearest- and third-nearest-neighbor Te atoms were clearly visualized. The second-nearest-neighbor Zn or Mn atoms were, however, barely visible, although they could be seen in the reference ZnTe crystal. This result is similar to the previous Mn Kα XFH data, and may suggest a rigid Te sublattice and a highly distorted cation sublattice, which contradicts a structural model for a similar diluted magnetic semiconductor Cd1-xMnxTe by Balzarotti et al.

Original languageEnglish
Pages (from-to)2707-2709
Number of pages3
JournalJournal of Magnetism and Magnetic Materials
Volume310
Issue number2 SUPPL. PART 3
DOIs
Publication statusPublished - 2007 Mar
Externally publishedYes

Keywords

  • Diluted magnetic semiconductor
  • Imaging
  • Local atomic structure
  • Mixed crystal
  • Synchrotron radiation

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

Fingerprint

Dive into the research topics of 'Three-dimensional structural image of Zn0.4Mn0.6Te diluted magnetic semiconductor obtained by X-ray fluorescence holography'. Together they form a unique fingerprint.

Cite this