TY - GEN
T1 - Three-terminal MTJ-based nonvolatile logic circuits with self-terminated writing mechanism for ultra-low-power VLSI processor
AU - Hanyu, Takahiro
AU - Suzuki, Daisuke
AU - Onizawa, Naoya
AU - Natsui, Masanori
N1 - Publisher Copyright:
© 2017 IEEE.
PY - 2017/5/11
Y1 - 2017/5/11
N2 - Magnetic-Tunnel Junction (MTJ)-based non-volatile logic circuits have some possibility to solve the power-dissipation problem seriously focusing on the present CMOS-only-based VLSI processors. Three terminal MTJ devices are the promising candidate as nonvolatile storage device to realize such a nonvolatile logic circuit. However, its writing energy is still serious in comparison with conventional CMOS-only-based logic circuits. In this paper, a new MTJ-based nonvolatile logic circuit with self-terminated mechanism is proposed and its energy efficiency is evaluated in comparison with the corresponding previous work. In addition, some recent research topics related to MTJ-based nonvolatile logic-circuit design and its application, such as a computer-aided-design (CAD) tool considering a stochastic MTJ-switching behavior and the application to a resilient 'die-hard' VLSI processor against sudden power-supply outage, are also demonstrated.
AB - Magnetic-Tunnel Junction (MTJ)-based non-volatile logic circuits have some possibility to solve the power-dissipation problem seriously focusing on the present CMOS-only-based VLSI processors. Three terminal MTJ devices are the promising candidate as nonvolatile storage device to realize such a nonvolatile logic circuit. However, its writing energy is still serious in comparison with conventional CMOS-only-based logic circuits. In this paper, a new MTJ-based nonvolatile logic circuit with self-terminated mechanism is proposed and its energy efficiency is evaluated in comparison with the corresponding previous work. In addition, some recent research topics related to MTJ-based nonvolatile logic-circuit design and its application, such as a computer-aided-design (CAD) tool considering a stochastic MTJ-switching behavior and the application to a resilient 'die-hard' VLSI processor against sudden power-supply outage, are also demonstrated.
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U2 - 10.23919/DATE.2017.7927048
DO - 10.23919/DATE.2017.7927048
M3 - Conference contribution
AN - SCOPUS:85020192290
T3 - Proceedings of the 2017 Design, Automation and Test in Europe, DATE 2017
SP - 548
EP - 553
BT - Proceedings of the 2017 Design, Automation and Test in Europe, DATE 2017
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 20th Design, Automation and Test in Europe, DATE 2017
Y2 - 27 March 2017 through 31 March 2017
ER -