THz Emission in a Dual-Grating-Gate HEMT Promoted by the Plasmonic Boom Instability

Tomotaka Hosotani, Akira Satou, Taiichi Otsuji

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We experimentally observed photomixed THz emission from a dual-grating-gate high-electron-mobility transistor under different bias conditions at 120 K with irradiating photomixed dual-CW-IR laser beams. The observed emission spectral peak frequencies meet well to the theoretical calculations for plasmon mode frequencies, suggesting the photomixed THz emission is amplified by the DC-current-driven plasmonic boom type instability when the electron drift velocity exceeds the plasmon velocity at the plasmon cavity boundary.

Original languageEnglish
Title of host publication2021 46th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2021
PublisherIEEE Computer Society
ISBN (Electronic)9781728194240
DOIs
Publication statusPublished - 2021
Event46th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2021 - Chengdu, China
Duration: 2021 Aug 302021 Sept 3

Publication series

NameInternational Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz
Volume2021-August
ISSN (Print)2162-2027
ISSN (Electronic)2162-2035

Conference

Conference46th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2021
Country/TerritoryChina
CityChengdu
Period21/8/3021/9/3

ASJC Scopus subject areas

  • Energy Engineering and Power Technology
  • Electrical and Electronic Engineering

Fingerprint

Dive into the research topics of 'THz Emission in a Dual-Grating-Gate HEMT Promoted by the Plasmonic Boom Instability'. Together they form a unique fingerprint.

Cite this