Abstract
A high-performance time-of-flight atomprobe was employed successfully in the composition analysis of zirconiated tungsten field emitters. Surface compositions were analyzed in situ under various emitter surface conditions with a mass resolution (m/ DELTA m) greater than equivalent to 2000. The study showed that nitrogen, instead of oxygen, may play a dominant role in the surface reaction and causes the building of pure tungsten in the (100) plane.
| Original language | English |
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| Title of host publication | Proceedings - The Electrochemical Society |
| Publisher | Electrochem Soc Inc |
| Pages | 68-72 |
| Number of pages | 5 |
| Volume | 80-6 |
| Publication status | Published - 1980 |
| Event | Proc on the Symp on Electron and Ion Beam Sci and Technol, 9th Int Conf - St Louis, MO, USA Duration: 1980 May 11 → 1980 May 16 |
Other
| Other | Proc on the Symp on Electron and Ion Beam Sci and Technol, 9th Int Conf |
|---|---|
| City | St Louis, MO, USA |
| Period | 80/5/11 → 80/5/16 |
ASJC Scopus subject areas
- Engineering(all)