TY - JOUR
T1 - Time-resolved x-ray diffraction measurement of C60 under high pressure and temperature using synchrotron radiation
AU - Horikawa, T.
AU - Suito, K.
AU - Kobayashi, M.
AU - Onodera, A.
PY - 2002/11/11
Y1 - 2002/11/11
N2 - C60 has been studied by means of time-resolved x-ray diffraction measurements using synchrotron radiation. Diffraction patterns were recorded at intervals of 1-10 min for samples under high pressure (12.5 and 14.3 GPa) and high temperature (up to 800°C) for, at the longest, 3 h. Time, pressure, and temperature dependences of the C60 structure are presented and the relevance to the hardness of materials derived from C60 is discussed.
AB - C60 has been studied by means of time-resolved x-ray diffraction measurements using synchrotron radiation. Diffraction patterns were recorded at intervals of 1-10 min for samples under high pressure (12.5 and 14.3 GPa) and high temperature (up to 800°C) for, at the longest, 3 h. Time, pressure, and temperature dependences of the C60 structure are presented and the relevance to the hardness of materials derived from C60 is discussed.
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U2 - 10.1088/0953-8984/14/44/319
DO - 10.1088/0953-8984/14/44/319
M3 - Article
AN - SCOPUS:0037064752
SN - 0953-8984
VL - 14
SP - 10483
EP - 10486
JO - Journal of Physics Condensed Matter
JF - Journal of Physics Condensed Matter
IS - 44 SPEC ISS.
ER -