Time-resolved X-ray diffraction study of C60 at high pressure and temperature

Takashi Horikawa, Kaichi Suito, Michihiro Kobayashi, Akifumi Onodera

Research output: Contribution to journalArticlepeer-review

23 Citations (Scopus)


Energy-dispersive X-ray diffraction measurements on C60 were undertaken at every 1-10 min interval while high temperature (200-800°C) was held constant for at longest 3 h under pressures of 12.5 and 14.3 GPa. The results from this and additional experiments have provided an insight into the time, pressure, and temperature dependency of the fullerene-derived superhard materials.

Original languageEnglish
Pages (from-to)143-151
Number of pages9
JournalPhysics Letters, Section A: General, Atomic and Solid State Physics
Issue number1-2
Publication statusPublished - 2001 Aug 20
Externally publishedYes


  • Fullerene
  • High pressure
  • X-ray diffraction

ASJC Scopus subject areas

  • Physics and Astronomy(all)


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