TY - JOUR
T1 - Time-resolved X-ray diffraction study of C60 at high pressure and temperature
AU - Horikawa, Takashi
AU - Suito, Kaichi
AU - Kobayashi, Michihiro
AU - Onodera, Akifumi
PY - 2001/8/20
Y1 - 2001/8/20
N2 - Energy-dispersive X-ray diffraction measurements on C60 were undertaken at every 1-10 min interval while high temperature (200-800°C) was held constant for at longest 3 h under pressures of 12.5 and 14.3 GPa. The results from this and additional experiments have provided an insight into the time, pressure, and temperature dependency of the fullerene-derived superhard materials.
AB - Energy-dispersive X-ray diffraction measurements on C60 were undertaken at every 1-10 min interval while high temperature (200-800°C) was held constant for at longest 3 h under pressures of 12.5 and 14.3 GPa. The results from this and additional experiments have provided an insight into the time, pressure, and temperature dependency of the fullerene-derived superhard materials.
KW - Fullerene
KW - High pressure
KW - X-ray diffraction
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U2 - 10.1016/S0375-9601(01)00345-0
DO - 10.1016/S0375-9601(01)00345-0
M3 - Article
AN - SCOPUS:0035920981
SN - 0375-9601
VL - 287
SP - 143
EP - 151
JO - Physics Letters, Section A: General, Atomic and Solid State Physics
JF - Physics Letters, Section A: General, Atomic and Solid State Physics
IS - 1-2
ER -