@inproceedings{2c28e2ae4119478aa25729aea0cca6b7,
title = "Time-resolved X-ray reflectometry in the multiwavelength dispersive geometry",
abstract = "A new method of measuring specular X-ray reflectivity curves with a time resolution of milliseconds to seconds is developed. A horizontally convergent X-ray beam having a one-to-one correlation between its direction and energy is realized by a curved crystal or a laterally graded multilayer on an elliptic substrate. The X-ray beam is then incident on the surface of the specimen placed at the focus in such a way that the glancing angle in the vertical direction is the same for all X-ray components, which are reflected in the vertical direction by the surface and diverge in the horizontal plane. The perpendicular momentum transfer continuously changes as a function of the horizontal ray direction since the wavelength change similarly. The normalized linear intensity distribution across the beam direction measured downstream of the specimen represents the X-ray reflectivity curve. Examples of time-resolved measurements of X-ray reflectivity curves are shown.",
keywords = "multi-wavelength dispersive, time-resolved X-ray reflectivity",
author = "Tadashi Matsushita and Etsuo Arakawa and Tetsuo Harada and Tadashi Hatano and Yasuo Higashi and Yano, {Yohko F.} and Yasuhiro Niwa and Yasuhiro Inada and Shusaku Nagano and Takahiro Seki",
year = "2010",
doi = "10.1063/1.3463368",
language = "English",
isbn = "9780735407824",
series = "AIP Conference Proceedings",
pages = "927--930",
booktitle = "SRI 2009 - The 10th International Conference on Synchrotron Radiation Instrumentation",
note = "10th International Conference on Synchrotron Radiation Instrumentation, SRI 2009 ; Conference date: 27-09-2009 Through 02-10-2009",
}