Abstract
The timing performance of TlBr detectors was evaluated at room temperature (22°C). 0.5-mm-thick planar TlBr detectors with Tl circular electrodes with a diameter of 3 mm were fabricated from TlBr crystals grown by the traveling molten zone method using a zone-purified material. The pulse rise time of the TlBr detector was measured using a digital oscilloscope as the cathode surface of the device was irradiated with a 22Na gamma-ray source. Coincidence timing spectra were obtained between the TlBr detector and a BaF2 scintillation detector when both detectors were irradiated with 511 keV positron annihilation gamma-rays. The timing resolution of the TlBr detector was found to be inversely proportional to the applied bias voltage. The TlBr detector, in coincidence with the BaF2 detector, exhibited timing resolutions characterized by a 6.5 ns full width at half maximum (FWHM) and an 8.5 ns FWHM with and without an energy window of 350 keV-560 keV, respectively.
Original language | English |
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Article number | 6555936 |
Pages (from-to) | 2883-2887 |
Number of pages | 5 |
Journal | IEEE Transactions on Nuclear Science |
Volume | 60 |
Issue number | 4 |
DOIs | |
Publication status | Published - 2013 |
Keywords
- Positron emission tomography
- semiconductor radiation detector
- thallium bromide
- timing resolution