TY - CHAP
T1 - Tunnel magnetoresistance effect in tunnel junctions with Co2MnSi heusler alloy electrode and MgO barrier
AU - Ando, Yasuo
AU - Tsunegi, Sumito
AU - Oogane, Mikihiko
AU - Naganuma, Hiroshi
AU - Takanashi, Koki
N1 - Publisher Copyright:
© Springer Science+Business Media Dordrecht 2013.
PY - 2013/1/1
Y1 - 2013/1/1
N2 - We demonstrated that a large TMR ratio of 753 % has been observed at 2 K in a MTJ using a Co2MnSi Heusler alloy electrode and a crystalline MgO tunnel barrier. At room temperature (RT), we also have observed a large TMR ratio of 217 %, which value at RT is much larger than that of MTJs using an amorphous Al-oxide tunnel barrier. However, the temperature dependence of the TMR ratio was still large. In order to improve the interface, we investigated the TMR effect in Co2MnSi/CoFeB(0-2 nm)/MgO/CoFe MTJs. TMR ratio was enhanced by inserting a thin CoFeB layer at the Co2MnSi/MgO interface. The MTJ with CoFeB thickness of 0.5 nm exhibited the highest TMR ratio. From the conductance-voltage measurements for the fabricated MTJs, we inferred that the highly spin polarized electron created in Co2MnSi can conserve the polarization through the 0.5 nm thick FeB layer.
AB - We demonstrated that a large TMR ratio of 753 % has been observed at 2 K in a MTJ using a Co2MnSi Heusler alloy electrode and a crystalline MgO tunnel barrier. At room temperature (RT), we also have observed a large TMR ratio of 217 %, which value at RT is much larger than that of MTJs using an amorphous Al-oxide tunnel barrier. However, the temperature dependence of the TMR ratio was still large. In order to improve the interface, we investigated the TMR effect in Co2MnSi/CoFeB(0-2 nm)/MgO/CoFe MTJs. TMR ratio was enhanced by inserting a thin CoFeB layer at the Co2MnSi/MgO interface. The MTJ with CoFeB thickness of 0.5 nm exhibited the highest TMR ratio. From the conductance-voltage measurements for the fabricated MTJs, we inferred that the highly spin polarized electron created in Co2MnSi can conserve the polarization through the 0.5 nm thick FeB layer.
UR - http://www.scopus.com/inward/record.url?scp=84955722841&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84955722841&partnerID=8YFLogxK
U2 - 10.1007/978-90-481-3832-6_17
DO - 10.1007/978-90-481-3832-6_17
M3 - Chapter
AN - SCOPUS:84955722841
SN - 9789048138319
SP - 355
EP - 366
BT - Spintronics
PB - Springer Netherlands
ER -