TY - JOUR
T1 - Two-dimensional measurement of focused hard X-ray beam profile using coherent X-ray diffraction of isolated nanoparticle
AU - Takahashi, Yukio
AU - Kubo, Hideto
AU - Tsutsumi, Ryosuke
AU - Sakaki, Shigeyuki
AU - Zettsu, Nobuyuki
AU - Nishino, Yoshinori
AU - Ishikawa, Tetsuya
AU - Yamauchi, Kazuto
N1 - Funding Information:
This research has been carried out at the Frontier Research Base for Global Young Researchers, Osaka University, in the Program of Promotion of Environmental Improvement to Enhance Young Researcher's Independence, the Special Coordination Funds for Promoting Science and Technology, from the Ministry of Education, Culture, Sports, Science and Technology (MEXT). This work was also partly supported by funds from a Grant-in-Aid for the “Promotion of X-ray Free Electron Laser Research”, Specially Promoted Research (No. 18002009), Young Scientists (No. 21686060), the Global COE Program “Center of Excellence for Atomically Controlled Fabrication Technology” from MEXT, Iketani Science and Technology Foundation, and Shimadzu Science Foundation.
PY - 2010/5/1
Y1 - 2010/5/1
N2 - A method for evaluating the two-dimensional photon density distribution in focused hard X-ray beams is proposed and demonstrated in a synchrotron experiment at SPring-8. A synchrotron X-ray beam of 11.8 keV is focused to a ∼ 1 μ m spot by Kirkpatrick-Baez mirrors. The two-dimensional intensity distribution of the focused beam is derived by monitoring the forward diffracted intensity from an isolated silver nanocube with an edge length of ∼ 150 nm positioned in the beam waist, which is two-dimensionally scanned. Furthermore, the photon density of X-rays illuminated onto the nanocube is estimated by utilizing coherent X-ray diffraction microscopy. This method is useful for evaluating the photon density distribution of hard X-ray beams focused to a spot size of less than a few micrometers.
AB - A method for evaluating the two-dimensional photon density distribution in focused hard X-ray beams is proposed and demonstrated in a synchrotron experiment at SPring-8. A synchrotron X-ray beam of 11.8 keV is focused to a ∼ 1 μ m spot by Kirkpatrick-Baez mirrors. The two-dimensional intensity distribution of the focused beam is derived by monitoring the forward diffracted intensity from an isolated silver nanocube with an edge length of ∼ 150 nm positioned in the beam waist, which is two-dimensionally scanned. Furthermore, the photon density of X-rays illuminated onto the nanocube is estimated by utilizing coherent X-ray diffraction microscopy. This method is useful for evaluating the photon density distribution of hard X-ray beams focused to a spot size of less than a few micrometers.
KW - Coherent X-ray diffraction microscopy
KW - Silver nanocube
KW - X-ray beam diagnosis
KW - X-ray mirror
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U2 - 10.1016/j.nima.2009.10.159
DO - 10.1016/j.nima.2009.10.159
M3 - Article
AN - SCOPUS:77950796570
SN - 0168-9002
VL - 616
SP - 266
EP - 269
JO - Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
JF - Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
IS - 2-3
ER -