Ultrahigh-density ferroelectric data storage with low bit error rate

Yoshiomi Hlranaga, Yasuo Cho

Research output: Contribution to journalArticlepeer-review

12 Citations (Scopus)

Abstract

Actual information data were recorded on a LiTaO3 single-crystal medium using a data storage system based on scanning nonlinear dielectric microscopy. For increasing recording density and reducing bit error rate, conductive-diamond-coated probes with a sharp tip and thin recording media were prepared. The domain-switching characteristics of virgin and prepolarized recording media were compared. The conditions of pulse voltage for writing were optimized. As a result, actual information data containing 128 × 128 bits were recorded at an areal density of 258 Gbit/inch2 without bit errors; thus, the bit error rate was calculated to be less than 1 × 10-4.

Original languageEnglish
Pages (from-to)6960-6963
Number of pages4
JournalJapanese Journal of Applied Physics
Volume44
Issue number9 B
DOIs
Publication statusPublished - 2005 Sept 22

Keywords

  • Bit error rate
  • Ferroelectric data storage
  • LiTaO
  • Scanning nonlinear dielectric microscopy

Fingerprint

Dive into the research topics of 'Ultrahigh-density ferroelectric data storage with low bit error rate'. Together they form a unique fingerprint.

Cite this