Abstract
Near-field scanning has often been used to measure and characterize magnetic fields surrounding individual integrated circuits (IC) and high speed digital electronic circuits. The objective of the work described herein is to use near-field scanning data, performed in a typical laboratory bench top environment, to predict radiated electromagnetic interference (EMI) in a typical product environment. The product environment may include enclosures and apertures.
| Original language | English |
|---|---|
| Pages (from-to) | 14-18 |
| Number of pages | 5 |
| Journal | IEEE International Symposium on Electromagnetic Compatibility |
| Volume | 1 |
| Publication status | Published - 2004 |
| Event | 2004 International Symposium on Electromagnetic Compatibility, EMC 2004 - Santa Clara, CA, United States Duration: 2004 Aug 9 → 2004 Aug 13 |
Keywords
- EMI
- Equivalent current
- Near-field