Using near-field scanning to predict radiated fields

Jin Shi, Michael A. Cracraft, Jianmin Zhang, Richard E. DuBroff, Kevin Slattery, Masahiro Yamaguchi

Research output: Contribution to journalConference articlepeer-review

58 Citations (Scopus)


Near-field scanning has often been used to measure and characterize magnetic fields surrounding individual integrated circuits (IC) and high speed digital electronic circuits. The objective of the work described herein is to use near-field scanning data, performed in a typical laboratory bench top environment, to predict radiated electromagnetic interference (EMI) in a typical product environment. The product environment may include enclosures and apertures.

Original languageEnglish
Pages (from-to)14-18
Number of pages5
JournalIEEE International Symposium on Electromagnetic Compatibility
Publication statusPublished - 2004
Event2004 International Symposium on Electromagnetic Compatibility, EMC 2004 - Santa Clara, CA, United States
Duration: 2004 Aug 92004 Aug 13


  • EMI
  • Equivalent current
  • Near-field


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