TY - GEN
T1 - Using selected-plaintext sets for efficient evaluation of EM information leakage from cryptographic devices
AU - Shimada, Haruki
AU - Hayashi, Yu Ichi
AU - Homma, Naofumi
AU - Mizuki, Takaaki
AU - Aoki, Takafumi
AU - Sone, Hideaki
PY - 2012
Y1 - 2012
N2 - In this paper, we present a method for selecting a specific set of acquired EM traces with the aim to improve the efficiency of EM analysis. The proposed method improves the correlation factor by using a set of selected plaintexts. We demonstrate the efficiency of our method through correlation electromagnetic analysis (CEMA) experiments conducted using SASEBO. The results clearly show the impact of selecting a subset of plaintexts on the outcome of CEMA. With this selection method, the proposed technique can be used for evaluating the security of cryptographic devices within a short period of time by using a small number of waveforms, even in cases where the noise is large, for example, outside a cryptographic device.
AB - In this paper, we present a method for selecting a specific set of acquired EM traces with the aim to improve the efficiency of EM analysis. The proposed method improves the correlation factor by using a set of selected plaintexts. We demonstrate the efficiency of our method through correlation electromagnetic analysis (CEMA) experiments conducted using SASEBO. The results clearly show the impact of selecting a subset of plaintexts on the outcome of CEMA. With this selection method, the proposed technique can be used for evaluating the security of cryptographic devices within a short period of time by using a small number of waveforms, even in cases where the noise is large, for example, outside a cryptographic device.
KW - cryptographic module
KW - electromagnetic information leakage
KW - hardware attack
KW - system security
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M3 - Conference contribution
AN - SCOPUS:84869425087
SN - 9781467322591
T3 - Proceedings of the SICE Annual Conference
SP - 64
EP - 67
BT - 2012 Proceedings of SICE Annual Conference, SICE 2012
PB - Society of Instrument and Control Engineers (SICE)
T2 - 2012 51st Annual Conference on of the Society of Instrument and Control Engineers of Japan, SICE 2012
Y2 - 20 August 2012 through 23 August 2012
ER -