TY - JOUR
T1 - Vacancies and electron trapping centers in acidic ammonothermal GaN probed by a monoenergetic positron beam
AU - Uedono, Akira
AU - Tsukada, Yusuke
AU - Mikawa, Yutaka
AU - Mochizuki, Tae
AU - Fujisawa, Hideo
AU - Ikeda, Hirotaka
AU - Kurihara, Kaori
AU - Fujito, Kenji
AU - Terada, Shigeru
AU - Ishibashi, Shoji
AU - Chichibu, Shigefusa F.
N1 - Funding Information:
This work was supported by the Council for Science, Technology and Innovation (CSTI), Cross-ministerial Strategic Innovation Promotion (SIP) Program, “Next-generation power electronics” (funding agency: NEDO ).
Publisher Copyright:
© 2016 Elsevier B.V. All rights reserved.
PY - 2016/8/15
Y1 - 2016/8/15
N2 - Defects in ammonothermal GaN have been studied using a monoenergetic positron beam. Through measurements of Doppler broadening spectra of the annihilation radiation, the major defect species was identified as a Ga vacancy coupled with impurities such as oxygen and/or hydrogen. Those defects were found to be stable even after annealing at 1000 °C. The shape parameter S for the Doppler broadening spectrum corresponding to positron annihilation at the surface was found to be decreased by illumination within energy ranges of 1.5-2.6 eV and 3.2-3.6 eV. This phenomenon is attributed to the suppression of recombinations between holes and electrons due to trapping centers, which can hold electrons for a long time, and a resultant accumulation of holes at the surface. Recovery of the S value required almost one day, but it was shortened by the annealing at 1000 °C.
AB - Defects in ammonothermal GaN have been studied using a monoenergetic positron beam. Through measurements of Doppler broadening spectra of the annihilation radiation, the major defect species was identified as a Ga vacancy coupled with impurities such as oxygen and/or hydrogen. Those defects were found to be stable even after annealing at 1000 °C. The shape parameter S for the Doppler broadening spectrum corresponding to positron annihilation at the surface was found to be decreased by illumination within energy ranges of 1.5-2.6 eV and 3.2-3.6 eV. This phenomenon is attributed to the suppression of recombinations between holes and electrons due to trapping centers, which can hold electrons for a long time, and a resultant accumulation of holes at the surface. Recovery of the S value required almost one day, but it was shortened by the annealing at 1000 °C.
KW - A1. Point defect
KW - A2. Single crystal growth
KW - B1. Nitrides
KW - B2. Semiconducting III-V materials
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U2 - 10.1016/j.jcrysgro.2016.05.015
DO - 10.1016/j.jcrysgro.2016.05.015
M3 - Article
AN - SCOPUS:84971012409
SN - 0022-0248
VL - 448
SP - 117
EP - 121
JO - Journal of Crystal Growth
JF - Journal of Crystal Growth
ER -