Original language | English |
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Pages (from-to) | 896-897 |
Number of pages | 2 |
Journal | Microscopy and Microanalysis |
Volume | 20 |
Issue number | 3 |
DOIs | |
Publication status | Published - 2014 Aug 1 |
Event | Microscopy and Microanalysis 2014, M and M 2014 - Hartford, United States Duration: 2014 Aug 3 → 2014 Aug 7 |
Valence electron states of carbon materials studied by TEM-SXES
Research output: Contribution to journal › Conference article › peer-review