TY - JOUR
T1 - Vapor-liquid-solid-like growth of thin film SiC by nanoscale alternating deposition of SiC and NiSi2
AU - Sannodo, Naoki
AU - Osumi, Asuka
AU - Maruyama, Shingo
AU - Matsumoto, Yuji
N1 - Funding Information:
This study was conducted under the Advanced Low Carbon Technology Research and Development Program (ALCA).
Publisher Copyright:
© 2020 Elsevier B.V.
PY - 2020/11/15
Y1 - 2020/11/15
N2 - We propose a vapour-liquid-solid (VLS)-like growth by alternately depositing nanoscale precursors of film and liquid flux using a pulsed laser deposition system with rapid beam deflection (RBD-PLD). The nanoscale alternating deposition of NiSi2 and SiC precursors on a 4H-SiC substrate at 1000 °C was found to suppress the formation of stacking faults and the carbon aggregates in the fabricated SiC films. As a result, the growth of high-quality 3C-SiC films having a flat surface with a step-and-terrace structure was achieved under the optimized conditions. The advantage of this process is that the required amount of the NiSi2 flux can be much reduced as compared to in the conventional VLS process; e.g., it could be as small as 5 vol% in volume ratio to the thin film SiC in the present case. The high crystallinity of the fabricated 3C-SiC thin films was also supported by their high visible photocurrent response ratio. The mechanism of the vapour-liquid-solid (VLS)-like growth is also discussed.
AB - We propose a vapour-liquid-solid (VLS)-like growth by alternately depositing nanoscale precursors of film and liquid flux using a pulsed laser deposition system with rapid beam deflection (RBD-PLD). The nanoscale alternating deposition of NiSi2 and SiC precursors on a 4H-SiC substrate at 1000 °C was found to suppress the formation of stacking faults and the carbon aggregates in the fabricated SiC films. As a result, the growth of high-quality 3C-SiC films having a flat surface with a step-and-terrace structure was achieved under the optimized conditions. The advantage of this process is that the required amount of the NiSi2 flux can be much reduced as compared to in the conventional VLS process; e.g., it could be as small as 5 vol% in volume ratio to the thin film SiC in the present case. The high crystallinity of the fabricated 3C-SiC thin films was also supported by their high visible photocurrent response ratio. The mechanism of the vapour-liquid-solid (VLS)-like growth is also discussed.
KW - Compound semiconductor
KW - Crystal growth
KW - Liquid flux
KW - Photocatalyst
KW - Pulsed laser deposition
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U2 - 10.1016/j.apsusc.2020.147153
DO - 10.1016/j.apsusc.2020.147153
M3 - Article
AN - SCOPUS:85087939338
SN - 0169-4332
VL - 530
JO - Applied Surface Science
JF - Applied Surface Science
M1 - 147153
ER -