Variation-resilient current-mode logic circuit design using MTJ devices

Youngkeun Kim; Masanori Natsui; Takahiro Hanyu

doi:10.1109/ISCAS.2012.6271866

Variation-resilient current-mode logic circuit design using MTJ devices

Youngkeun Kim, Masanori Natsui, Takahiro Hanyu

RIEC - Computing System Platforms Division

Tohoku University

Research output: Contribution to conference › Paper › peer-review

5 Citations (Scopus)

Abstract

A current-mode logic-circuit style using MTJ devices as threshold voltage (V _th) variation compensating elements is proposed for realizing a process-variation-aware VLSI processor with maintaining a higher performance capability. The faulty logic-operation behavior due to V _th variation of each MOS transistor can be neglected by adjusting resistance values of MTJ devices that are connected to the source electrode of MOS transistors in series. By using HSPICE simulation under a 90nm CMOS technology, it is demonstrated that basic current-mode logic gates using the proposed method are robust against the V _th variation.

Original language	English
Pages	2705-2708
Number of pages	4
DOIs	https://doi.org/10.1109/ISCAS.2012.6271866
Publication status	Published - 2012
Event	2012 IEEE International Symposium on Circuits and Systems, ISCAS 2012 - Seoul, Korea, Republic of Duration: 2012 May 20 → 2012 May 23

Conference

Conference	2012 IEEE International Symposium on Circuits and Systems, ISCAS 2012
Country/Territory	Korea, Republic of
City	Seoul
Period	12/5/20 → 12/5/23

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10.1109/ISCAS.2012.6271866

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abstract = "A current-mode logic-circuit style using MTJ devices as threshold voltage (V th) variation compensating elements is proposed for realizing a process-variation-aware VLSI processor with maintaining a higher performance capability. The faulty logic-operation behavior due to V th variation of each MOS transistor can be neglected by adjusting resistance values of MTJ devices that are connected to the source electrode of MOS transistors in series. By using HSPICE simulation under a 90nm CMOS technology, it is demonstrated that basic current-mode logic gates using the proposed method are robust against the V th variation.",

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AB - A current-mode logic-circuit style using MTJ devices as threshold voltage (V th) variation compensating elements is proposed for realizing a process-variation-aware VLSI processor with maintaining a higher performance capability. The faulty logic-operation behavior due to V th variation of each MOS transistor can be neglected by adjusting resistance values of MTJ devices that are connected to the source electrode of MOS transistors in series. By using HSPICE simulation under a 90nm CMOS technology, it is demonstrated that basic current-mode logic gates using the proposed method are robust against the V th variation.

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Variation-resilient current-mode logic circuit design using MTJ devices

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