Abstract
Introducing the Johnson-Kendall-Roberts (JKR) analysis to force-distance curve measurements of atomic force microscopy allows determination of the Young's modulus and adhesion energy. Combining this method with force mapping measurement, we obtained the distribution of these mechanical properties at nanometer lateral resolution. We applied this technique to an elastomer blend. We showed an image of the deviation from the JKR curve, which represents the distribution of viscoelastic properties because a force-distance curve on viscoelastic materials does not follow the JKR elastic theory. We measured the speed dependency of two elastomer components using force measurements. We also investigated the stress-relaxation measurements; a few milliseconds of relaxation time was observed. Combining stress relaxation measurement with force mapping measurement, the distribution of force relaxed during 10 ms was acquired, which also clarified local distribution of viscoelastic properties.
Original language | English |
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Pages (from-to) | 435-442 |
Number of pages | 8 |
Journal | KOBUNSHI RONBUNSHU |
Volume | 69 |
Issue number | 7 |
DOIs | |
Publication status | Published - 2012 Jul |
Externally published | Yes |
Keywords
- Atomic force microscopy
- Force mapping
- Force-Distance curve
- Nanomechanical properties
- Voscoelasticity
ASJC Scopus subject areas
- Chemical Engineering (miscellaneous)
- Materials Science (miscellaneous)
- Environmental Science(all)
- Polymers and Plastics