Voltage and Frequency Dependence of Capacitance Characteristics in Organic MOS Capacitors

Yoshinari Kimura; Yoshiaki Hattori; Masatoshi Kitamura

doi:10.1109/ICIPRM.2019.8819249

Voltage and Frequency Dependence of Capacitance Characteristics in Organic MOS Capacitors

Yoshinari Kimura, Yoshiaki Hattori, Masatoshi Kitamura

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

1 Citation (Scopus)

Abstract

Pentacene metal-oxide-semiconductor capacitors having a channel area uncovered with the top electrode have been examined by capacitance-voltage (C-V) and capacitance-frequency (C-f) measurements. The C-V and C-f characteristics were reproduced using an equivalent circuit based on a distributed constant circuit. The sheet resistance, which characterizes carrier transport in the pentacene film, was obtained as a sheet resistance included in the equivalent circuit reproducing the measured characteristics.

Original language	English
Title of host publication	2019 Compound Semiconductor Week, CSW 2019 - Proceedings
Publisher	Institute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)	9781728100807
DOIs	https://doi.org/10.1109/ICIPRM.2019.8819249
Publication status	Published - 2019 May
Externally published	Yes
Event	2019 Compound Semiconductor Week, CSW 2019 - Nara, Japan Duration: 2019 May 19 → 2019 May 23

Publication series

Name	2019 Compound Semiconductor Week, CSW 2019 - Proceedings

Conference

Conference	2019 Compound Semiconductor Week, CSW 2019
Country/Territory	Japan
City	Nara
Period	19/5/19 → 19/5/23

Keywords

C-V characteristics
C-f characteristics
organic MOS capacitors
pentacene

ASJC Scopus subject areas

Electrical and Electronic Engineering
Industrial and Manufacturing Engineering
Electronic, Optical and Magnetic Materials
Materials Chemistry
Atomic and Molecular Physics, and Optics

Access to Document

10.1109/ICIPRM.2019.8819249

Cite this

Voltage and Frequency Dependence of Capacitance Characteristics in Organic MOS Capacitors. / Kimura, Yoshinari; Hattori, Yoshiaki; Kitamura, Masatoshi.

2019 Compound Semiconductor Week, CSW 2019 - Proceedings. Institute of Electrical and Electronics Engineers Inc., 2019. 8819249 (2019 Compound Semiconductor Week, CSW 2019 - Proceedings).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Kimura, Y, Hattori, Y & Kitamura, M 2019, Voltage and Frequency Dependence of Capacitance Characteristics in Organic MOS Capacitors. in 2019 Compound Semiconductor Week, CSW 2019 - Proceedings., 8819249, 2019 Compound Semiconductor Week, CSW 2019 - Proceedings, Institute of Electrical and Electronics Engineers Inc., 2019 Compound Semiconductor Week, CSW 2019, Nara, Japan, 19/5/19. https://doi.org/10.1109/ICIPRM.2019.8819249

@inproceedings{5eee5a885ca140be83a82666bf8bfbae,

title = "Voltage and Frequency Dependence of Capacitance Characteristics in Organic MOS Capacitors",

abstract = "Pentacene metal-oxide-semiconductor capacitors having a channel area uncovered with the top electrode have been examined by capacitance-voltage (C-V) and capacitance-frequency (C-f) measurements. The C-V and C-f characteristics were reproduced using an equivalent circuit based on a distributed constant circuit. The sheet resistance, which characterizes carrier transport in the pentacene film, was obtained as a sheet resistance included in the equivalent circuit reproducing the measured characteristics.",

keywords = "C-V characteristics, C-f characteristics, organic MOS capacitors, pentacene",

author = "Yoshinari Kimura and Yoshiaki Hattori and Masatoshi Kitamura",

note = "Publisher Copyright: {\textcopyright} 2019 IEEE.; 2019 Compound Semiconductor Week, CSW 2019 ; Conference date: 19-05-2019 Through 23-05-2019",

year = "2019",

month = may,

doi = "10.1109/ICIPRM.2019.8819249",

language = "English",

series = "2019 Compound Semiconductor Week, CSW 2019 - Proceedings",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

booktitle = "2019 Compound Semiconductor Week, CSW 2019 - Proceedings",

}

TY - GEN

T1 - Voltage and Frequency Dependence of Capacitance Characteristics in Organic MOS Capacitors

AU - Kimura, Yoshinari

AU - Hattori, Yoshiaki

AU - Kitamura, Masatoshi

PY - 2019/5

Y1 - 2019/5

N2 - Pentacene metal-oxide-semiconductor capacitors having a channel area uncovered with the top electrode have been examined by capacitance-voltage (C-V) and capacitance-frequency (C-f) measurements. The C-V and C-f characteristics were reproduced using an equivalent circuit based on a distributed constant circuit. The sheet resistance, which characterizes carrier transport in the pentacene film, was obtained as a sheet resistance included in the equivalent circuit reproducing the measured characteristics.

AB - Pentacene metal-oxide-semiconductor capacitors having a channel area uncovered with the top electrode have been examined by capacitance-voltage (C-V) and capacitance-frequency (C-f) measurements. The C-V and C-f characteristics were reproduced using an equivalent circuit based on a distributed constant circuit. The sheet resistance, which characterizes carrier transport in the pentacene film, was obtained as a sheet resistance included in the equivalent circuit reproducing the measured characteristics.

KW - C-V characteristics

KW - C-f characteristics

KW - organic MOS capacitors

KW - pentacene

UR - http://www.scopus.com/inward/record.url?scp=85072960089&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=85072960089&partnerID=8YFLogxK

U2 - 10.1109/ICIPRM.2019.8819249

DO - 10.1109/ICIPRM.2019.8819249

M3 - Conference contribution

AN - SCOPUS:85072960089

T3 - 2019 Compound Semiconductor Week, CSW 2019 - Proceedings

BT - 2019 Compound Semiconductor Week, CSW 2019 - Proceedings

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 2019 Compound Semiconductor Week, CSW 2019

Y2 - 19 May 2019 through 23 May 2019

ER -

Voltage and Frequency Dependence of Capacitance Characteristics in Organic MOS Capacitors

Abstract

Publication series

Conference

Keywords

ASJC Scopus subject areas

Access to Document

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